Inventor · disambiguated record
Jonathan M. Mckenna
Also filed as: MCKENNA JONATHAN M
5 granted patents·195 citations·filing 1999–2003
84Inventor score
Files withIBM5
Top patents by PatentIndex Score
5 records- 0195US6731179B2System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI)IBM·Filed 2002·Granted May 4, 2004·96 cites·20 claims
- 0292US6624031B2Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structureIBM·Filed 2001·Granted Sep 23, 2003·62 cites·13 claims
- 0366US7132325B2Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structureIBM·Filed 2003·Granted Nov 7, 2006·10 cites·19 claims
- 0459US6188234B1Method of determining dielectric time-to-breakdownIBM·Filed 1999·Granted Feb 13, 2001·22 cites·18 claims
- 0556US6770907B2Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structureIBM·Filed 2003·Granted Aug 3, 2004·5 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →