Inventor · disambiguated record
Martin Yaffe
Also filed as: YAFFE MARTIN · YAFFE MARTIN J
8 granted patents·3 pending applications·100 citations·filing 1985–2018
84Inventor score
Files withSUNNYBROOK RES INST3HIGHNAM RALPH2SUNNYBROOK & WOMENS COLLEGE2CLARKE GINA1MATAKINA TECHNOLOGY LTD1
Top patents by PatentIndex Score
11 records- 0188US8120683B1High resoultion digital imaging apparatusTUMER TUMAY O·Filed 2000·Granted Feb 21, 2012·65 cites·57 claims
- 0276US9008382B2Method and system for analysing tissue from imagesHIGHNAM RALPH·Filed 2010·Granted Apr 14, 2015·6 cites·10 claims
- 0372US9865067B2Method of reconstruction of an object from projection viewsHIGHNAM RALPH·Filed 2014·Granted Jan 9, 2018·4 cites·4 claims
- 0457US10595805B2Systems and methods for generating an imaging biomarker that indicates detectability of conspicuity of lesions in a mammographic imageSUNNYBROOK RES INST·Filed 2015·Granted Mar 24, 2020·1 cites·29 claims
- 0557US10070829B2System and method for low x-ray dose breast density evaluationSUNNYBROOK RES INST·Filed 2014·Granted Sep 11, 2018·0 cites·11 claims
- 0654US4638502AAnthropomorphic phantomsONTARIO CANCER INST·Filed 1985·Granted Jan 20, 1987·18 cites·22 claims
- 0751US2019021682A1System and Method for Low X-Ray Dose Breast Density EvaluationSUNNYBROOK RES INST·Filed 2018·Application pending·0 cites
- 0845US7286632B2Method and apparatus for measuring the thickness of compressed objectsSUNNYBROOK & WOMENS COLLEGE·Filed 2003·Granted Oct 23, 2007·6 cites·9 claims
- 0935US2011052025A1System for imaging pathway verificationMATAKINA TECHNOLOGY LTD·Filed 2010·Application pending·0 cites
- 1033US9506841B2Tissue slicer system having a tissue slicing mold for rapid grossing and hypersampling of large surgical specimensCLARKE GINA·Filed 2015·Granted Nov 29, 2016·0 cites·16 claims
- 1133US2006167355A1Method and apparatus for determining peripheral breast thicknessSUNNYBROOK & WOMENS COLLEGE·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →