Inventor · disambiguated record
Martin B. Mollat
Also filed as: MOLLAT MARTIN · MOLLAT MARTIN B
12 granted patents·30 citations·filing 2005–2022
86Inventor score
Top patents by PatentIndex Score
12 records- 0185US7262109B2Integrated circuit having a transistor level top side wafer contact and a method of manufacture thereforTEXAS INSTRUMENTS INC·Filed 2005·Granted Aug 28, 2007·15 cites·15 claims
- 0272US7466009B2Method for reducing dislocation threading using a suppression implantTEXAS INSTRUMENTS INC·Filed 2006·Granted Dec 16, 2008·3 cites·11 claims
- 0369US12464761B2LOCOS fillet for drain reduced breakdown in high voltage transistorsTEXAS INSTRUMENTS INC·Filed 2022·Granted Nov 4, 2025·0 cites·18 claims
- 0468US7118958B2Method of manufacturing a metal-insulator-metal capacitor using an etchback processTEXAS INSTRUMENTS INC·Filed 2005·Granted Oct 10, 2006·4 cites·24 claims
- 0560US8436635B2Semiconductor wafer having test modules including pin matrix selectable test devicesMOLLAT MARTIN B·Filed 2009·Granted May 7, 2013·4 cites·10 claims
- 0656US7638415B2Method for reducing dislocation threading using a suppression implantTEXAS INSTRUMENTS INC·Filed 2008·Granted Dec 29, 2009·0 cites·9 claims
- 0753US7838429B2Method to manufacture a thin film resistorTEXAS INSTRUMENTS INC·Filed 2007·Granted Nov 23, 2010·2 cites·14 claims
- 0850US7415378B2Methods for analyzing critical defects in analog integrated circuitsTEXAS INSTRUMENTS INC·Filed 2005·Granted Aug 19, 2008·2 cites·20 claims
- 0949US7709329B2High-voltage variable breakdown voltage (BV) diode for electrostatic discharge (ESD) applicationsTEXAS INSTRUMENTS INC·Filed 2007·Granted May 4, 2010·0 cites·15 claims
- 1047US7986010B2High-voltage variable breakdown voltage (BV) diode for electrostatic discharge (ESD) applicationsTEXAS INSTRUMENTS INC·Filed 2010·Granted Jul 26, 2011·0 cites·16 claims
- 1146US8174077B2High-voltage variable breakdown voltage (BV) diode for electrostatic discharge (ESD) applicationsMOLLAT MARTIN B·Filed 2011·Granted May 8, 2012·0 cites·10 claims
- 1241US7776625B2Method for locating a sub-surface feature using a scatterometerTEXAS INSTRUMENTS INC·Filed 2006·Granted Aug 17, 2010·0 cites·17 claims
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