Assignee
MOLLAT MARTIN B
US·2 granted patents·4 citations·filing 2009–2011
Top patents by PatentIndex Score
2 records- 0160US8436635B2Semiconductor wafer having test modules including pin matrix selectable test devicesMOLLAT MARTIN B·Filed 2009·Granted May 7, 2013·4 cites·10 claims
- 0246US8174077B2High-voltage variable breakdown voltage (BV) diode for electrostatic discharge (ESD) applicationsMOLLAT MARTIN B·Filed 2011·Granted May 8, 2012·0 cites·10 claims
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