Inventor · disambiguated record
Yan-Cheng Chen
Also filed as: CHEN YAN · CHEN YAN-CHENG
13 granted patents·10 pending applications·50 citations·filing 2007–2024
87Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD12BEIJING CREATRON INSTITUTE OF PHARMACEUTICAL RES CO LTD2CHINA PETROLEUM & CHEM CORP2BEIJING STAR NEW MATERIAL CO LTD1FORMOSA PLASTICS CORP1
Top patents by PatentIndex Score
23 records- 0195US11764094B2Semiconductor processing tool and methods of operationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Sep 19, 2023·2 cites·20 claims
- 0293US11816411B2Method and system for semiconductor wafer defect reviewTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Nov 14, 2023·5 cites·20 claims
- 0389US7553542B2Functionalized magnetizable microspheres and preparation thereofUNIV NAT DEFENSE·Filed 2007·Granted Jun 30, 2009·38 cites·20 claims
- 0488US12119273B2System and method for high speed inspection of semiconductor substratesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Oct 15, 2024·1 cites·20 claims
- 0583US11749571B2System and method for high speed inspection of semiconductor substratesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Sep 5, 2023·1 cites·20 claims
- 0681US12087611B2Semiconductor processing tool and methods of operationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Sep 10, 2024·0 cites·20 claims
- 0778US2024379401A1Semiconductor processing tool and methods of operationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0875US12190036B2Method and system for semiconductor wafer defect reviewTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jan 7, 2025·0 cites·20 claims
- 0974US2024379463A1Systems for inspection of semiconductor substratesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1072US9233852B2Method of producing highly dispersed graphene organic dispersion and application thereofUNIV KUN SHAN·Filed 2014·Granted Jan 12, 2016·2 cites·7 claims
- 1172US2024387212A1Apparatus and methods for determining fluid dynamics of liquid film on wafer surfaceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1267US2023384211A1In-situ apparatus for detecting abnormality in process tubeTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 1366US10526422B2Process for preparation and purification of Sugammades sodiumBEIJING CREATRON INSTITUTE OF PHARMACEUTICAL RES CO LTD·Filed 2018·Granted Jan 7, 2020·1 cites·40 claims
- 1461US12326397B2In-situ apparatus for detecting abnormality in process tubeTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 10, 2025·0 cites·20 claims
- 1561US12272576B2Apparatus and methods for determining fluid dynamics of liquid film on wafer surfaceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Apr 8, 2025·0 cites·20 claims
- 1656US2025249444A1Metal pollution-resistant catalyst and preparation method thereforCHINA PETROLEUM & CHEM CORP·Filed 2022·Application pending·0 cites
- 1755US2024219427A1Positioning method and probe system for performing the same, method for operating probe system, and method for utilizing probe system to produce a tested semiconductor deviceMPI CORP·Filed 2024·Application pending·0 cites
- 1853US2022403174A1Method for preparing colorant having target color and colorantUNIV FUDAN·Filed 2022·Application pending·0 cites
- 1951US11065604B2Catalyst for producing light aromatics with heavy aromatics, method for preparing the catalyst, and use thereofCHINA PETROLEUM & CHEM CORP·Filed 2018·Granted Jul 20, 2021·0 cites·24 claims
- 2051US2025287479A1Microwave heat processing apparatusFORMOSA PLASTICS CORP·Filed 2024·Application pending·0 cites
- 2144US9295982B2MOF-based hierarchical porous materials and methods for preparationBEIJING STAR NEW MATERIAL CO LTD·Filed 2014·Granted Mar 29, 2016·0 cites·8 claims
- 2240US2012299701A1Method and apparatus for passcode entryZOU YANMING·Filed 2009·Application pending·0 cites
- 2321US2018016359A1Sugammadex preparation and purification methodBEIJING CREATRON INSTITUTE OF PHARMACEUTICAL RES CO LTD·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →