Inventor · disambiguated record
William Brearley
Also filed as: BREARLEY WILLIAM · BREARLEY WILLIAM H · BREARLEY WILLIAM HARRINGTON
17 granted patents·329 citations·filing 1994–2019
93Inventor score
Files withIBM17
Top patents by PatentIndex Score
17 records- 0197US6531069B1Reactive Ion Etching chamber design for flip chip interconnectionsIBM·Filed 2000·Granted Mar 11, 2003·144 cites·16 claims
- 0290US6293457B1Integrated method for etching of BLM titanium-tungsten alloys for CMOS devices with copper metallizationIBM·Filed 2000·Granted Sep 25, 2001·86 cites·23 claims
- 0387US8584060B1Block mask decomposition for mitigating corner roundingIBM·Filed 2012·Granted Nov 12, 2013·5 cites·20 claims
- 0479US7645700B2Dry etchback of interconnect contactsIBM·Filed 2007·Granted Jan 12, 2010·5 cites·22 claims
- 0573US5735452ABall grid array by partitioned lamination processIBM·Filed 1996·Granted Apr 7, 1998·38 cites·12 claims
- 0668US7323410B2Dry etchback of interconnect contactsIBM·Filed 2005·Granted Jan 29, 2008·2 cites·8 claims
- 0766US6099935AApparatus for providing solder interconnections to semiconductor and electronic packaging devicesIBM·Filed 1995·Granted Aug 8, 2000·24 cites·2 claims
- 0861US11182531B2Optical rule checking for detecting at risk structures for overlay issuesIBM·Filed 2019·Granted Nov 23, 2021·0 cites·20 claims
- 0960US11163934B2Optical rule checking for detecting at risk structures for overlay issuesIBM·Filed 2019·Granted Nov 2, 2021·0 cites·15 claims
- 1054US10395002B2Optical rule checking for detecting at risk structures for overlay issuesIBM·Filed 2017·Granted Aug 27, 2019·0 cites·16 claims
- 1153US10339261B2Optical rule checking for detecting at risk structures for overlay issuesIBM·Filed 2015·Granted Jul 2, 2019·0 cites·19 claims
- 1253US9607268B2Optical rule checking for detecting at risk structures for overlay issuesIBM·Filed 2016·Granted Mar 28, 2017·0 cites·17 claims
- 1348US9330223B2Optical rule checking for detecting at risk structures for overlay issuesIBM·Filed 2012·Granted May 3, 2016·0 cites·17 claims
- 1443US5722579ABottom-surface-metallurgy rework process in ceramic modulesIBM·Filed 1996·Granted Mar 3, 1998·13 cites·22 claims
- 1540US6149048AApparatus and method for use in manufacturing semiconductor devicesIBM·Filed 1998·Granted Nov 21, 2000·7 cites·48 claims
- 1636US6448169B1Apparatus and method for use in manufacturing semiconductor devicesIBM·Filed 1995·Granted Sep 10, 2002·5 cites·7 claims
- 1723US5690784AIon milling end point detection method and apparatusIBM·Filed 1994·Granted Nov 25, 1997·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →