Inventor · disambiguated record
Toshiki Oono
Also filed as: OONO TOSHIKI
5 granted patents·28 citations·filing 2002–2019
74Inventor score
Top patents by PatentIndex Score
5 records- 0172US6768542B2Defect inspecting device for substrate to be processed and method of manufacturing semiconductor deviceRENESAS TECH CORP·Filed 2002·Granted Jul 27, 2004·18 cites·11 claims
- 0261US12105055B2Backing material for ultrasonic probe, method of manufacturing same, and ultrasonic probeMITSUBISHI PENCIL CO·Filed 2019·Granted Oct 1, 2024·0 cites·8 claims
- 0358US6993854B2Centrifugal dryer, manufacturing method for semiconductor device and semiconductor manufacturing apparatusMITSUBISHI ELECTRIC ENG·Filed 2002·Granted Feb 7, 2006·8 cites·10 claims
- 0452US10297244B2Carbon-based acoustic matching layer and method for producing sameMITSUBISHI PENCIL CO·Filed 2015·Granted May 21, 2019·0 cites·11 claims
- 0552US6864982B2Gas analyzing method and gas analyzer for semiconductor treaterRENESAS TECH CORP·Filed 2002·Granted Mar 8, 2005·2 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →