Inventor · disambiguated record
Richard T. Housley
Also filed as: HOUSLEY RICHARD · HOUSLEY RICHARD T
20 granted patents·5 pending applications·38 citations·filing 2010–2025
92Inventor score
Top patents by PatentIndex Score
25 records- 0188US11009798B2Wafer alignment markers, systems, and related methodsMICRON TECHNOLOGY INC·Filed 2018·Granted May 18, 2021·5 cites·24 claims
- 0288US8674522B1Castle-like chop mask for forming staggered datalines for improved contact isolation and pattern thereofPRATT DAVID·Filed 2012·Granted Mar 18, 2014·10 cites·11 claims
- 0383US8039340B2Methods of forming an array of memory cells, methods of forming a plurality of field effect transistors, methods of forming source/drain regions and isolation trenches, and methods of forming a series of spaced trenches into a substrateMICRON TECHNOLOGY INC·Filed 2010·Granted Oct 18, 2011·5 cites·9 claims
- 0482US8796086B2Methods of forming an array of memory cells, methods of forming a plurality of field effect transistors, methods of forming source/drain regions and isolation trenches, and methods of forming a series of spaced trenches into a substrateMICRON TECHNOLOGY INC·Filed 2013·Granted Aug 5, 2014·4 cites·12 claims
- 0580US10461038B1Methods of alignment marking semiconductor wafers, and semiconductor packages having portions of alignment markingsMICRON TECHNOLOGY INC·Filed 2018·Granted Oct 29, 2019·2 cites·37 claims
- 0678US8389353B2Methods of forming an array of memory cells, methods of forming a plurality of field effect transistors, methods of forming source/drain regions and isolation trenches, and methods of forming a series of spaced trenches into a substrateDAVIS NEAL L·Filed 2011·Granted Mar 5, 2013·4 cites·5 claims
- 0771US8664077B2Method for forming self-aligned overlay markNAIR VINAY·Filed 2012·Granted Mar 4, 2014·2 cites·19 claims
- 0869US8779918B2Convulsive seizure detection and notification systemHOUSLEY RICHARD·Filed 2011·Granted Jul 15, 2014·2 cites·38 claims
- 0969US8435859B2Methods of forming electrical contactsHOUSLEY RICHARD T·Filed 2011·Granted May 7, 2013·3 cites·14 claims
- 1066US11520240B2Wafer alignment markers, systems, and related methodsMICRON TECHNOLOGY INC·Filed 2021·Granted Dec 6, 2022·0 cites·20 claims
- 1165US12230546B2Wafer registration and overlay measurement systems and related methodsMICRON TECHNOLOGY INC·Filed 2021·Granted Feb 18, 2025·0 cites·20 claims
- 1265US8586429B2Methods of forming an array of memory cells, methods of forming a plurality of field effect transistors, methods of forming source/drain regions and isolation trenches, and methods of forming a series of spaced trenches into a substrateDAVIS NEAL L·Filed 2012·Granted Nov 19, 2013·1 cites·13 claims
- 1360US10756022B2Methods of alignment marking semiconductor wafers, and semiconductor packages having portions of alignment markingsMICRON TECHNOLOGY INC·Filed 2019·Granted Aug 25, 2020·0 cites·19 claims
- 1458US2024243072A1Integrated Circuitry, Memory Circuitry Comprising Strings Of Memory Cells, And Methods Used In Forming Integrated CircuitryMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1556US11251096B2Wafer registration and overlay measurement systems and related methodsMICRON TECHNOLOGY INC·Filed 2018·Granted Feb 15, 2022·0 cites·22 claims
- 1655US9343114B2Memory arrays and methods of forming electrical contactsMICRON TECHNOLOGY INC·Filed 2014·Granted May 17, 2016·0 cites·8 claims
- 1755US2025379106A1Measuring tilt in semiconductor manufacturingMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1854US2024074194A1Memory device including staircase structures and adjacent trench structuresMICRON TECHNOLOGY INC·Filed 2023·Application pending·0 cites
- 1954US2024257875A1Integrated Circuitry, Memory Circuitry Comprising Strings Of Memory Cells, And Methods Used In Forming Integrated CircuitryMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2053US8796786B2Memory arrays and methods of forming electrical contactsMICRON TECHNOLOGY INC·Filed 2013·Granted Aug 5, 2014·0 cites·8 claims
- 2149US9324721B2Pitch-halving integrated circuit processNANYA TECHNOLOGY CORP·Filed 2015·Granted Apr 26, 2016·0 cites·10 claims
- 2248US9245844B2Pitch-halving integrated circuit process and integrated circuit structure made therebyPRATT DAVID STORRS·Filed 2013·Granted Jan 26, 2016·0 cites·6 claims
- 2344US11784077B2Wafer overlay marks, overlay measurement systems, and related methodsMICRON TECHNOLOGY INC·Filed 2019·Granted Oct 10, 2023·0 cites·19 claims
- 2444US11075169B2Integrated-circuitry overlay alignment mark, a substrate comprising an overlay alignment mark, a method of forming an overlay alignment mark in the fabrication of integrated circuitry, and a method of determining overlay alignment in the fabrication of integrated circuitryMICRON TECHNOLOGY INC·Filed 2018·Granted Jul 27, 2021·0 cites·25 claims
- 2535US2014054756A1Anti spacer process and semiconductor structure generated by the anti spacer processHYATT MICHAEL·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →