Inventor · disambiguated record
Jin-Eun Kim
Also filed as: KIM JIN EUN
6 granted patents·3 pending applications·11 citations·filing 2005–2025
73Inventor score
Files withSAMSUNG ELECTRONICS CO LTD5KIM JIN-EUN1NAT DISASTER MANAGEMENT RES INST1PARK JONG-JIN1SEOUL NAT UNIV IND FOUNDATION1
Top patents by PatentIndex Score
9 records- 0183US9029252B2Nanostructure, optical device including the same, and methods of manufacturing the nanostructure and the optical deviceSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted May 12, 2015·6 cites·31 claims
- 0272US9279937B2Optical interconnection for stacked integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Mar 8, 2016·3 cites·18 claims
- 0362US2025299577A1Method for providing alarm of flooded underpass based on water level measurement and vehicle movement analysisNAT DISASTER MANAGEMENT RES INST·Filed 2025·Application pending·0 cites
- 0461US9626887B2Image display device and method and apparatus for implementing augmented reality using unidirectional beamSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Apr 18, 2017·1 cites·18 claims
- 0552US9499400B2Optical devices and methods of controlling propagation directions of light from the optical devicesKIM JIN-EUN·Filed 2012·Granted Nov 22, 2016·1 cites·45 claims
- 0650US9341753B2Optical device and method of controlling propagation directions of light and surface plasmon by using the optical deviceSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted May 17, 2016·0 cites·18 claims
- 0750US9207369B2Optical modulator and method of manufacturing the optical modulatorSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Dec 8, 2015·0 cites·15 claims
- 0837US2012153264A1Methods For Forming Organic Thin Film, Organic Thin Films, Thin Film Transistors Including The Same, And Electric Devices Including The SamePARK JONG-JIN·Filed 2011·Application pending·0 cites
- 0930US2008093550A1Method For Adhering Nanostructures to End of Probe of Microscope and Microscope Having Probe Made By the Same MethodSEOUL NAT UNIV IND FOUNDATION·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →