Inventor · disambiguated record
Hajime Hiroi
Also filed as: HIROI HAJIME
4 granted patents·92 citations·filing 1991–1998
77Inventor score
Top patents by PatentIndex Score
4 records- 0179US6373267B1Ball grid array-integrated circuit testing deviceANDO ELECTRIC COMPANY·Filed 1998·Granted Apr 16, 2002·64 cites·3 claims
- 0241US6005762ACooling system of a semiconductor testing device using a control computerANDO ELECTRIC·Filed 1998·Granted Dec 21, 1999·13 cites·7 claims
- 0335US5305331AData logging apparatus with memory and pattern testing deviceANDO ELECTRIC·Filed 1991·Granted Apr 19, 1994·8 cites·2 claims
- 0434US6089463ACooling system of a semiconductor testing deviceANDO ELECTRIC·Filed 1998·Granted Jul 18, 2000·7 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →