Inventor · disambiguated record
Niels De Jonge
Also filed as: DE JONGE NIELS
7 granted patents·1 pending application·33 citations·filing 2005–2024
79Inventor score
Files withLEIBNIZ INSTITUT FUER NEUE MAT GEMEINNUETZIGE GMBH3BRUKER AXS SE1DAHMEN TIM1DE JONGE NIELS1KONINKL PHILIPS ELECTRONICS NV1
Top patents by PatentIndex Score
8 records- 0185US7777185B2Method and apparatus for a high-resolution three dimensional confocal scanning transmission electron microscopeUT BATTELLE LLC·Filed 2007·Granted Aug 17, 2010·12 cites·22 claims
- 0285US7288773B2Electron source, and charged-particle apparatus comprising such an electron sourceKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Granted Oct 30, 2007·10 cites·24 claims
- 0382US9207196B2Transmission electron microscopy for imaging live cellsDE JONGE NIELS·Filed 2011·Granted Dec 8, 2015·11 cites·5 claims
- 0456US2025123223A1Method for investigating a nanoscale biological specimen in an electron beam instrument, with reduced radiation damageBRUKER AXS SE·Filed 2024·Application pending·0 cites
- 0547US9966223B2Device for correlative scanning transmission electron microscopy (STEM) and light microscopyLEIBNIZ INSTITUT FUER NEUE MAT GEMEINNUETZIGE GMBH·Filed 2015·Granted May 8, 2018·0 cites·13 claims
- 0635US9857320B2Device and method for the stoichiometric analysis of samplesLEIBNIZ-INSTITUT FUER NEUE MAT GEMEINNUETZIGE GMBH·Filed 2015·Granted Jan 2, 2018·0 cites·19 claims
- 0730US11499967B2Specific protein marker and method for identifying the statistic distribution of protein stoichiometryLEIBNIZ INSTITUT FUER NEUE MAT GEMEINNUETZIGE GMBH·Filed 2015·Granted Nov 15, 2022·0 cites·9 claims
- 0828US10319559B2Method and device for testing samples by means of an electron or ion beam microscopeDAHMEN TIM·Filed 2016·Granted Jun 11, 2019·0 cites·25 claims
Join the waitlist — get patent alerts
Get an alert when Niels De Jonge files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →