Inventor · disambiguated record
Alberto Pagani
Also filed as: PAGANI ALBERTO
137 granted patents·8 pending applications·423 citations·filing 1988–2023
99Inventor score
Files withST MICROELECTRONICS SRL113PAGANI ALBERTO23FINOCCHIARO ALESSANDRO2INDENA SPA2CANEGALLO ROBERTO1
Top patents by PatentIndex Score
145 records- 0198US8362620B2Electronic devices with extended metallization layer on a passivation layerST MICROELECTRONICS SRL·Filed 2010·Granted Jan 29, 2013·40 cites·17 claims
- 0296US10598578B2Tensile stress measurement device with attachment plates and related methodsST MICROELECTRONICS SRL·Filed 2017·Granted Mar 24, 2020·9 cites·22 claims
- 0396US9966318B1System for electrical testing of through silicon vias (TSVs)ST MICROELECTRONICS SRL·Filed 2017·Granted May 8, 2018·13 cites·26 claims
- 0496US8358147B2Testing integrated circuitsST MICROELECTRONICS SRL·Filed 2010·Granted Jan 22, 2013·17 cites·36 claims
- 0595US9804047B2Integrated pressure sensor with double measuring scale, pressure measuring device including the integrated pressure sensor, braking system, and method of measuring a pressure using the integrated pressure sensorST MICROELECTRONICS SRL·Filed 2016·Granted Oct 31, 2017·9 cites·23 claims
- 0694US9799630B2Integrated electronic device with transceiving antenna and magnetic interconnectionST MICROELECTRONICS SRL·Filed 2016·Granted Oct 24, 2017·4 cites·29 claims
- 0794US9464952B2Integrated electronic device for monitoring mechanical stress within a solid structureST MICROELECTRONICS SRL·Filed 2013·Granted Oct 11, 2016·11 cites·27 claims
- 0893US10794783B2Pressure sensing device with cavity and related methodsST MICROELECTRONICS SRL·Filed 2018·Granted Oct 6, 2020·5 cites·29 claims
- 0993US9514879B2Signal transmission through LC resonant circuitsST MICROELECTRONICS SRL·Filed 2014·Granted Dec 6, 2016·9 cites·15 claims
- 1092US9224694B2Traceable integrated circuits and production method thereofPAGANI ALBERTO·Filed 2011·Granted Dec 29, 2015·11 cites·17 claims
- 1192US9111895B2System and method for electrical testing of through silicon vias (TSVs)PAGANI ALBERTO·Filed 2011·Granted Aug 18, 2015·10 cites·28 claims
- 1292US8362796B2Testing integrated circuits using few test probesST MICROELECTRONICS SRL·Filed 2009·Granted Jan 29, 2013·15 cites·24 claims
- 1391US10250163B2Inverse electrowetting energy harvesting and scavenging methods, circuits and systemsST MICROELECTRONICS SRL·Filed 2016·Granted Apr 2, 2019·5 cites·21 claims
- 1491US9835515B2Pressure sensor with testing device and related methodsST MICROELECTRONICS SRL·Filed 2014·Granted Dec 5, 2017·9 cites·28 claims
- 1591US9791303B2Package, made of building material, for a parameter monitoring device, within a solid structure, and relative deviceST MICROELECTRONICS SRL·Filed 2013·Granted Oct 17, 2017·10 cites·37 claims
- 1691US9778117B2Integrated electronic device for monitoring pressure within a solid structureST MICROELECTRONICS SRL·Filed 2014·Granted Oct 3, 2017·14 cites·37 claims
- 1791US9541601B2Testing architecture of circuits integrated on a waferPAGANI ALBERTO·Filed 2012·Granted Jan 10, 2017·9 cites·14 claims
- 1891US9146273B2Process for controlling the correct positioning of test probes on terminations of electronic devices integrated on a semiconductor and corresponding electronic devicePAGANI ALBERTO·Filed 2010·Granted Sep 29, 2015·8 cites·25 claims
- 1990US8378346B2Circuit architecture for the parallel supplying during electric or electromagnetic testing of a plurality of electronic devices integrated on a semiconductor waferST MICROELECTRONICS SRL·Filed 2011·Granted Feb 19, 2013·11 cites·19 claims
- 2089US9188635B2Integrated circuit comprising at least an integrated antennaPAGANI ALBERTO·Filed 2012·Granted Nov 17, 2015·6 cites·44 claims
- 2188US10868479B2Inverse electrowetting and magnetic energy harvesting and scavenging methods, circuits and systemsST MICROELECTRONICS SRL·Filed 2018·Granted Dec 15, 2020·3 cites·20 claims
- 2288US10746787B2Testing architecture of circuits integrated on a waferST MICROELECTRONICS SRL·Filed 2018·Granted Aug 18, 2020·4 cites·2 claims
- 2388US9176185B2Active probe card for electrical wafer sort of integrated circuitsCANEGALLO ROBERTO·Filed 2012·Granted Nov 3, 2015·10 cites·25 claims
- 2488US9112263B2Electronic communications device with antenna and electromagnetic shieldPAGANI ALBERTO·Filed 2011·Granted Aug 18, 2015·8 cites·26 claims
- 2587US10180456B2Testing architecture of circuits integrated on a waferST MICROELECTRONICS SRL·Filed 2016·Granted Jan 15, 2019·4 cites·10 claims
- 2686US12248012B2Method for producing a probe used for testing integrated electronic circuitsST MICROELECTRONICS SRL·Filed 2023·Granted Mar 11, 2025·0 cites·14 claims
- 2786US9134367B2Sensing structure of alignment of a probe for testing integrated circuitsPAGANI ALBERTO·Filed 2011·Granted Sep 15, 2015·5 cites·25 claims
- 2885US9939338B2Pressure sensing device with cavity and related methodsST MICROELECTRONICS SRL·Filed 2015·Granted Apr 10, 2018·3 cites·24 claims
- 2985US9874598B2System and method for electrical testing of through silicon vias (TSVs)ST MICROELECTRONICS SRL·Filed 2015·Granted Jan 23, 2018·3 cites·20 claims
- 3085US9726587B2Tensile stress measurement device with attachment plates and related methodsST MICROELECTRONICS SRL·Filed 2015·Granted Aug 8, 2017·2 cites·38 claims
- 3185US9097637B2Integrated electronic device for monitoring parameters within a solid structure and monitoring system using such a devicePAGANI ALBERTO·Filed 2011·Granted Aug 4, 2015·5 cites·27 claims
- 3285US9000788B2Method for performing an electrical testing of electronic devicesPAGANI ALBERTO·Filed 2009·Granted Apr 7, 2015·12 cites·32 claims
- 3385US8907693B2Electromagnetic shield for testing integrated circuitsPAGANI ALBERTO·Filed 2010·Granted Dec 9, 2014·4 cites·21 claims
- 3484US10267849B2Sensing structure of alignment of a probe for testing integrated circuitsST MICROELECTRONICS SRL·Filed 2017·Granted Apr 23, 2019·2 cites·22 claims
- 3583US10788389B2Pressure sensor with testing device and related methodsST MICROELECTRONICS SRL·Filed 2017·Granted Sep 29, 2020·2 cites·24 claims
- 3683US10366969B2Integrated electronic device with transceiving antenna and magnetic interconnectionST MICROELECTRONICS SRL·Filed 2017·Granted Jul 30, 2019·1 cites·27 claims
- 3783US9823300B2Process for controlling the correct positioning of test probes on terminations of electronic devices integrated on a semiconductor and corresponding electronic deviceST MICROELECTRONICS SRL·Filed 2015·Granted Nov 21, 2017·2 cites·27 claims
- 3883US9728837B2Method and apparatus for tuning a resonant circuit using a laserST MICROELECTRONICS SRL·Filed 2015·Granted Aug 8, 2017·3 cites·22 claims
- 3982US10001453B2Integrated electronic device for monitoring humidity and/or corrosionST MICROELECTRONICS SRL·Filed 2014·Granted Jun 19, 2018·3 cites·16 claims
- 4082US9874586B2Electromagnetic shield for testing integrated circuitsST MICROELECTRONICS SRL·Filed 2014·Granted Jan 23, 2018·3 cites·26 claims
- 4182US9318516B2High-frequency optoelectronic detector, system and methodST MICROELECTRONICS SRL·Filed 2013·Granted Apr 19, 2016·2 cites·17 claims
- 4282US8902016B2Signal transmission through LC resonant circuitsPAGANI ALBERTO·Filed 2010·Granted Dec 2, 2014·7 cites·50 claims
- 4381US10715216B2Network of electronic devices assembled on a flexible support and communication methodST MICROELECTRONICS SRL·Filed 2019·Granted Jul 14, 2020·2 cites·15 claims
- 4480US10876999B2Block made of a building materialST MICROELECTRONICS SRL·Filed 2019·Granted Dec 29, 2020·2 cites·26 claims
- 4580US9413055B2Packaged electronic device with integrated electronic circuits having transceiving antennasST MICROELECTRONICS SRL·Filed 2014·Granted Aug 9, 2016·4 cites·21 claims
- 4680US9257499B2Connection structure for an integrated circuit with capacitive functionST MICROELECTRONICS SRL·Filed 2013·Granted Feb 9, 2016·5 cites·9 claims
- 4780US9076883B2Integrated electronic device with transceiving antenna and magnetic interconnectionST MICROELECTRONICS SRL·Filed 2013·Granted Jul 7, 2015·2 cites·28 claims
- 4879US9887165B2IC with insulating trench and related methodsST MICROELECTRONICS SRL·Filed 2014·Granted Feb 6, 2018·3 cites·22 claims
- 4979US9442159B2Testing integrated circuits using few test probesST MICROELECTRONICS SRL·Filed 2012·Granted Sep 13, 2016·3 cites·23 claims
- 5079US9322839B2Magnetic inertial sensor and method for operating the sameST MICROELECTRONICS SRL·Filed 2013·Granted Apr 26, 2016·4 cites·27 claims
Showing the top 50 of 145 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →