Inventor · disambiguated record
Shuji Shibuya
Also filed as: SHIBUYA SHUJI
6 granted patents·110 citations·filing 1996–2003
85Inventor score
Top patents by PatentIndex Score
6 records- 0179US6455335B1Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test stepHITACHI LTD·Filed 2000·Granted Sep 24, 2002·17 cites·10 claims
- 0277US6566150B2Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test stepHITACHI LTD·Filed 2002·Granted May 20, 2003·15 cites·1 claims
- 0371US6292066B1Function generator, crystal oscillation device and method of adjusting crystal oscillation deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Sep 18, 2001·47 cites·28 claims
- 0453US6197603B1Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test stepHITACHI LTD·Filed 1998·Granted Mar 6, 2001·12 cites·4 claims
- 0550US7198962B2Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test stepHITACHI LTD·Filed 2003·Granted Apr 3, 2007·3 cites·5 claims
- 0649US5719533AFunction generatorMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Feb 17, 1998·16 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →