Inventor · disambiguated record
Pei-Ying Hsueh
Also filed as: HSUEH PEI-YING
7 granted patents·0 citations·filing 2014–2024
67Inventor score
Files withREALTEK SEMICONDUCTOR CORP7
Top patents by PatentIndex Score
7 records- 0165US12320849B2Clock control circuit and methodREALTEK SEMICONDUCTOR CORP·Filed 2024·Granted Jun 3, 2025·0 cites·20 claims
- 0261US11287472B2Chip and testing method thereofREALTEK SEMICONDUCTOR CORP·Filed 2020·Granted Mar 29, 2022·0 cites·20 claims
- 0350US12320847B2Test device for testing on-chip clock controller having debug functionREALTEK SEMICONDUCTOR CORP·Filed 2023·Granted Jun 3, 2025·0 cites·10 claims
- 0447US10698029B2ChipREALTEK SEMICONDUCTOR CORP·Filed 2019·Granted Jun 30, 2020·0 cites·11 claims
- 0546US11774497B2Isolation circuit having test mechanism and test method thereofREALTEK SEMICONDUCTOR CORP·Filed 2021·Granted Oct 3, 2023·0 cites·10 claims
- 0646US9983264B2Multiple defect diagnosis method and machine readable mediaREALTEK SEMICONDUCTOR CORP·Filed 2014·Granted May 29, 2018·0 cites·14 claims
- 0740US9213799B2Systematic defect analysis method and machine readable mediaREALTEK SEMICONDUCTOR CORP·Filed 2014·Granted Dec 15, 2015·0 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →