Inventor · disambiguated record
Gangning Wang
Also filed as: WANG GANGNING
11 granted patents·2 pending applications·14 citations·filing 2007–2017
83Inventor score
Files withSEMICONDUCTOR MFG INT SHANGHAI3SEMICONDUCTOR MFG INT SHANGHAI CORP3SEMICONDUCTOR MFG INTERNATIONAL (SHANGHAI) CORPORATION3SEMICONDUCTOR MFG INT BEIJING2SEMICONDUCTOR MFG INT CORP1
Top patents by PatentIndex Score
13 records- 0178US9653344B2Device isolation structure and manufacture methodSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2015·Granted May 16, 2017·3 cites·10 claims
- 0276US9112025B2LDMOS device and fabrication methodSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Aug 18, 2015·5 cites·20 claims
- 0372US9837323B2Semiconductor structure and fabrication method thereofSEMICONDUCTOR MFG INTERNATIONAL (SHANGHAI) CORPORATION·Filed 2016·Granted Dec 5, 2017·2 cites·19 claims
- 0460US7648882B2SONOS flash memory and method for fabricating the sameSEMICONDUCTORS MFG INTERNAT SH·Filed 2007·Granted Jan 19, 2010·4 cites·7 claims
- 0549US10615259B2Semiconductor device, related manufacturing method, and related electronic deviceSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2017·Granted Apr 7, 2020·0 cites·20 claims
- 0648US9824914B2Method for manufacturing a device isolation structureSEMICONDUCTOR MFG INTERNATIONAL (SHANGHAI) CORPORATION·Filed 2017·Granted Nov 21, 2017·0 cites·6 claims
- 0748US9287397B2Semiconductor device and method of fabricating sameSEMICONDUCTOR MFG INT CORP·Filed 2013·Granted Mar 15, 2016·0 cites·12 claims
- 0847US9653600B2Semiconductor device and method of fabricating sameSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2016·Granted May 16, 2017·0 cites·8 claims
- 0947US7977734B2SONOS flash memorySEMICONDUCTOR MFG INT SHANGHAI·Filed 2009·Granted Jul 12, 2011·0 cites·1 claims
- 1046US9859372B2Semiconductor device, related manufacturing method, and related electronic deviceSEMICONDUCTOR MFG INTERNATIONAL (SHANGHAI) CORPORATION·Filed 2016·Granted Jan 2, 2018·0 cites·8 claims
- 1140US2008132076A1Method for avoiding polysilicon defectSEMICONDUCTOR MFG INT SHANGHAI·Filed 2007·Application pending·0 cites
- 1236US2015179571A1Metal interconnect structures and fabrication method thereofSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Application pending·0 cites
- 1334US9159785B2Semiconductor device having buried layer and method for forming the sameSEMICONDUCTOR MFG INT SHANGHAI·Filed 2013·Granted Oct 13, 2015·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →