Inventor · disambiguated record
Pekka M. Typpo
Also filed as: TYPPO PEKKA · TYPPO PEKKA M · TYPPO PEKKA MATTI · TYPPOE PEKKA
26 granted patents·4 pending applications·412 citations·filing 1977–2011
97Inventor score
Top patents by PatentIndex Score
30 records- 0188US4107606ANon-contacting electromagnetic thickness gauge for sheet measurement having improved small distance sensitivityMEASUREX CORP·Filed 1977·Granted Aug 15, 1978·43 cites·5 claims
- 0283US7768629B2Device and process for optical distance measurementVOITH PATENT GMBH·Filed 2007·Granted Aug 3, 2010·13 cites·43 claims
- 0380US6498646B1Apparatus and process for determining the properties of a material webVOITH SULZER PAPIERTECH PATENT·Filed 2000·Granted Dec 24, 2002·20 cites·54 claims
- 0478US7423758B1Gloss sensor for a paper machineVOITH PATENT GMBH·Filed 2007·Granted Sep 9, 2008·5 cites·29 claims
- 0577US4791367AContacting thickness gauge for moving sheet materialIMPACT SYSTEMS INC·Filed 1987·Granted Dec 13, 1988·32 cites·4 claims
- 0677US4748400AMethod for controlling the amount of moisture associated with a web of moving materialIMPACT SYSTEMS INC·Filed 1987·Granted May 31, 1988·39 cites·5 claims
- 0774US4107847AContacting caliper gaugeMEASUREX CORP·Filed 1977·Granted Aug 22, 1978·20 cites·5 claims
- 0873US4791353AScanning combination thickness and moisture gauge for moving sheet materialIMPACT SYSTEMS INC·Filed 1987·Granted Dec 13, 1988·31 cites·3 claims
- 0969US5010766AError compensation for measuring gaugesIMPACT SYSTEMS INC·Filed 1989·Granted Apr 30, 1991·28 cites·9 claims
- 1069US4225243AGas measuring apparatus with standardization means, and method thereforMEASUREX CORP·Filed 1978·Granted Sep 30, 1980·20 cites·5 claims
- 1168US7151380B2Microwave water weight sensor and processVOITH PAPER PATENT GMBH·Filed 2004·Granted Dec 19, 2006·8 cites·41 claims
- 1264US6031620AGloss sensor resistant to tilting and shifting paper and with improved calibrationIMPACT SYSTEMS INC·Filed 1998·Granted Feb 29, 2000·26 cites·14 claims
- 1363US5132619AThickness gauge having a low unsprung weight for moving sheet material for lightweight paperIMPACT SYSTEMS INC·Filed 1991·Granted Jul 21, 1992·23 cites·8 claims
- 1463US4432224AHydrogen sulfide measuring systems and the likeDELPHIAN CORP·Filed 1982·Granted Feb 21, 1984·19 cites·10 claims
- 1561US9046349B2Method and device for contactless determination of the thickness of a web of material, including correction of the alignment errorTYPPO PEKKA·Filed 2011·Granted Jun 2, 2015·3 cites·14 claims
- 1660US4929895AThickness gauge for moving sheet material with inner and outer flexibly mounted bearingsIMPACT SYSTEMS INC·Filed 1989·Granted May 29, 1990·17 cites·8 claims
- 1760US4134211AContacting caliper gaugeMEASUREX CORP·Filed 1977·Granted Jan 16, 1979·12 cites·9 claims
- 1859US4247205AGas measuring apparatus with standardization means, and method thereforMEASUREX CORP·Filed 1979·Granted Jan 27, 1981·14 cites·7 claims
- 1957US7437208B2System for computer-aided measurement of quality and/or process data in a paper machineVOITH PATENT GMBH·Filed 2004·Granted Oct 14, 2008·8 cites·55 claims
- 2052US4789431AApparatus for sensing the thickness of a pulp suspension on the forming wire of a paper machineIMPACT SYSTEMS INC·Filed 1987·Granted Dec 6, 1988·14 cites·7 claims
- 2147US7482590B2Method for determining the coating quantity on a material webVOITH PATENT GMBH·Filed 2006·Granted Jan 27, 2009·0 cites·23 claims
- 2247US7071480B2Sensor with alignment self compensationVOITH PAPER PATENT GMBH·Filed 2003·Granted Jul 4, 2006·0 cites·32 claims
- 2347US6995372B2Nuclear gauge for measuring a characteristic of a sheet material with sheet position and alignment compensationVOITH PAPER PATENT GMBH·Filed 2003·Granted Feb 7, 2006·0 cites·29 claims
- 2445US7345772B2Optical triangulation device and method of measuring a variable of a web using the deviceVOITH PAPER PATENT GMBH·Filed 2004·Granted Mar 18, 2008·2 cites·60 claims
- 2545US6145211AContacting thickness gauge for moving sheet materialIMPACT SYSTEMS INC·Filed 1998·Granted Nov 14, 2000·7 cites·15 claims
- 2645US2006208194A1Microwave mass measuring device and processVOITH PAPER PATENT GMBH·Filed 2005·Application pending·0 cites
- 2742US6133578ANuclear gauge for measuring a characteristic of moving sheet material and alignment compensationIMPACT SYSTEMS INC·Filed 1998·Granted Oct 17, 2000·8 cites·10 claims
- 2842US2007263228A1Device and process for optical distance measurementVOITH PAPER PATENT GMBH·Filed 2006·Application pending·0 cites
- 2938US2006232790A1Confocal measurement method and apparatus in a paper machineCHASE LEE·Filed 2005·Application pending·0 cites
- 3031US2013003047A1Method for contactless determination of the thickness of a web of materialTYPPO PEKKA·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →