Inventor · disambiguated record
Jan Andries Meijer
Also filed as: MEIJER JAN · MEIJER JAN ANDRIES
7 granted patents·1 pending application·17 citations·filing 2003–2022
78Inventor score
Top patents by PatentIndex Score
8 records- 0181US10571498B2System for analysis of a microwave frequency signal by imagingTHALES SA·Filed 2015·Granted Feb 25, 2020·5 cites·19 claims
- 0271US9665014B2Charged particle lithography system with alignment sensor and beam measurement sensorMAPPER LITHOGRAPHY IP BV·Filed 2013·Granted May 30, 2017·2 cites·18 claims
- 0367US7126139B2Device and method of positionally accurate implantation of individual particles in a substrate surfaceUNIV CALIFORNIA·Filed 2003·Granted Oct 24, 2006·7 cites·27 claims
- 0466US9030675B2Method for determining a distance between two beamlets in a multi-beamlet exposure apparatusMEIJER JAN ANDRIES·Filed 2011·Granted May 12, 2015·3 cites·27 claims
- 0558US2025236945A1Method of Implanting Atoms in a Substrate and Method of Forming a Quantum RegisterUNIV ULM·Filed 2022·Application pending·0 cites
- 0654USRE49732ECharged particle lithography system with alignment sensor and beam measurement sensorASML NETHERLANDS BV·Filed 2013·Granted Nov 21, 2023·0 cites·30 claims
- 0742US9240306B2Device for spot size measurement at wafer level using a knife edge and a method for manufacturing such a deviceMAPPER LITHOGRAPHY IP BV·Filed 2012·Granted Jan 19, 2016·0 cites·37 claims
- 0832US8479311B2Device and method for an atomic force microscope for the study and modification of surface propertiesKUBSKY STEFAN·Filed 2008·Granted Jul 2, 2013·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →