Inventor · disambiguated record
Yoko Wasai
Also filed as: WASAI YOKO
6 granted patents·40 citations·filing 2002–2010
81Inventor score
Files withHORIBA LTD6
Top patents by PatentIndex Score
6 records- 0182US7688446B2Sample analyzing method, sample analyzing apparatus, manufacturing method of organic EL element, manufacturing equipment, and recording mediumHORIBA LTD·Filed 2006·Granted Mar 30, 2010·8 cites·32 claims
- 0270US7167242B2Sample analysis methodHORIBA LTD·Filed 2005·Granted Jan 23, 2007·4 cites·20 claims
- 0367US7196793B2Method for analyzing thin-film layer structure using spectroscopic ellipsometerHORIBA LTD·Filed 2002·Granted Mar 27, 2007·14 cites·34 claims
- 0465US8013997B2Sample analyzing method, sample analyzing apparatus, manufacturing method of organic EL element, manufacturing equipment, and recording mediumHORIBA LTD·Filed 2010·Granted Sep 6, 2011·2 cites·20 claims
- 0563US7280210B2Measuring method, analyzing method, measuring apparatus, analyzing apparatus, ellipsometer, and computer programHORIBA LTD·Filed 2005·Granted Oct 9, 2007·7 cites·19 claims
- 0661US7271901B2Thin-film characteristic measuring method using spectroellipsometerHORIBA LTD·Filed 2002·Granted Sep 18, 2007·5 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →