Inventor · disambiguated record
Richard H. Warner
Also filed as: WARNER RICHARD H
12 granted patents·738 citations·filing 1992–2007
95Inventor score
Top patents by PatentIndex Score
12 records- 0197US6335628B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2001·Granted Jan 1, 2002·102 cites·5 claims
- 0296US6492822B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2001·Granted Dec 10, 2002·64 cites·8 claims
- 0396US5345170AWafer probe station having integrated guarding, Kelvin connection and shielding systemsCASCADE MICROTECH INC·Filed 1992·Granted Sep 6, 1994·166 cites·7 claims
- 0495US6720782B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2002·Granted Apr 13, 2004·53 cites·8 claims
- 0594US6232788B1Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 1997·Granted May 15, 2001·98 cites·8 claims
- 0694US5663653AWafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 1995·Granted Sep 2, 1997·91 cites·15 claims
- 0792US7589518B2Wafer probe station having a skirting componentCASCADE MICROTECH INC·Filed 2005·Granted Sep 15, 2009·10 cites·5 claims
- 0891US7492147B2Wafer probe station having a skirting componentCASCADE MICROTECH INC·Filed 2007·Granted Feb 17, 2009·8 cites·10 claims
- 0991US7330023B2Wafer probe station having a skirting componentCASCADE MICROTECH INC·Filed 2005·Granted Feb 12, 2008·9 cites·4 claims
- 1090US5434512AWafer probe station having integrated guarding, Kelvin connection and shielding systemsCASCADE MICROTECH INC·Filed 1994·Granted Jul 18, 1995·73 cites·2 claims
- 1186US5237267AWafer probe station having auxiliary chucksCASCADE MICROTECH INC·Filed 1992·Granted Aug 17, 1993·60 cites·13 claims
- 1261US6980012B2Wafer probe station for low-current measurementsCASCASE MICROTECH INC·Filed 2003·Granted Dec 27, 2005·4 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →