Inventor · disambiguated record
Nan-Hsin Tseng
Also filed as: TSENG NAN-HSIN
20 granted patents·1 pending application·76 citations·filing 2010–2020
92Inventor score
Files withTAIWAN SEMICONDUCTOR MFG8TAIWAN SEMICONDUCTOR MFG CO LTD6TSENG NAN-HSIN5CHEN JI-JAN1LIU YEN-LING1
Top patents by PatentIndex Score
21 records- 0194US9269537B2E-beam lithography with alignment gatingTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Feb 23, 2016·26 cites·20 claims
- 0293US8832511B2Built-in self-test for interposerCHEN JI-JAN·Filed 2011·Granted Sep 9, 2014·25 cites·24 claims
- 0386US8113412B1Methods for detecting defect connections between metal bumpsTSENG NAN-HSIN·Filed 2011·Granted Feb 14, 2012·7 cites·20 claims
- 0480US7986591B2Ultra high resolution timing measurementTAIWAN SEMICONDUCTOR MFG·Filed 2010·Granted Jul 26, 2011·4 cites·20 claims
- 0572US8384430B2RC delay detectors with high sensitivity for through substrate viasTAIWAN SEMICONDUCTOR MFG·Filed 2010·Granted Feb 26, 2013·4 cites·24 claims
- 0671US8937512B1Voltage-controlled oscillatorTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jan 20, 2015·3 cites·20 claims
- 0767US10868494B2Device and method of operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 15, 2020·1 cites·21 claims
- 0867US8614571B2Apparatus and method for on-chip sampling of dynamic IR voltage dropTSENG NAN-HSIN·Filed 2011·Granted Dec 24, 2013·2 cites·18 claims
- 0966US8981842B1Integrated circuit comprising buffer chainTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Mar 17, 2015·1 cites·20 claims
- 1065US8680882B23D-IC interposer testing structure and method of testing the structureTSENG NAN-HSIN·Filed 2011·Granted Mar 25, 2014·2 cites·13 claims
- 1164US11283402B2Device and method of operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Mar 22, 2022·0 cites·20 claims
- 1261US9059685B2Circuit and method for pulse width measurementTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jun 16, 2015·1 cites·20 claims
- 1358US9714979B2Contactless signal testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jul 25, 2017·0 cites·20 claims
- 1454US9423452B2Contactless signal testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Aug 23, 2016·0 cites·20 claims
- 1552US8305847B2Ultra high resolution timing measurementTSENG NAN-HSIN·Filed 2011·Granted Nov 6, 2012·0 cites·20 claims
- 1651US9478469B2Integrated circuit comprising buffer chainTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Oct 25, 2016·0 cites·20 claims
- 1743US9117796B2Semiconductor arrangement and formation thereofTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Aug 25, 2015·0 cites·20 claims
- 1841US10277206B2Integrated circuit with an oscillating signal-generating assemblyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Apr 30, 2019·0 cites·20 claims
- 1940US9310431B2Diagnosis framework to shorten yield learning cycles of advanced processesLIU YEN-LING·Filed 2012·Granted Apr 12, 2016·0 cites·20 claims
- 2038US2016091563A1Scan flip-flopTAIWAN SEMICONDUCTOR MFG·Filed 2014·Application pending·0 cites
- 2136US8339155B2System and method for detecting soft-failsTSENG NAN-HSIN·Filed 2010·Granted Dec 25, 2012·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →