Inventor · disambiguated record
Keen Fung Wai
Also filed as: WAI KEEN FUNG · WAI KEEN FUNG JASON
3 granted patents·31 citations·filing 2004–2005
70Inventor score
Files withAGILENT TECHNOLOGIES INC3
Top patents by PatentIndex Score
3 records- 0175US7253606B2Framework that maximizes the usage of testhead resources in in-circuit test systemAGILENT TECHNOLOGIES INC·Filed 2005·Granted Aug 7, 2007·10 cites·5 claims
- 0263US7324982B2Method and apparatus for automated debug and optimization of in-circuit testsAGILENT TECHNOLOGIES INC·Filed 2004·Granted Jan 29, 2008·12 cites·6 claims
- 0356US7089139B2Method and apparatus for configuration of automated debug of in-circuit testsAGILENT TECHNOLOGIES INC·Filed 2004·Granted Aug 8, 2006·9 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →