Inventor · disambiguated record
Alexander J. Swinton
Also filed as: SWINTON ALEXANDER J
3 granted patents·292 citations·filing 1997–1999
78Inventor score
Files withIBM3
Top patents by PatentIndex Score
3 records- 0196US6069068ASub-quarter-micron copper interconnections with improved electromigration resistance and reduced defect sensitivityIBM·Filed 1997·Granted May 30, 2000·224 cites·12 claims
- 0273US6258710B1Sub-quarter-micron copper interconnections with improved electromigration resistance and reduced defect sensitivityIBM·Filed 1999·Granted Jul 10, 2001·39 cites·9 claims
- 0362US6037795AMultiple device test layoutIBM·Filed 1997·Granted Mar 14, 2000·29 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →