Inventor · disambiguated record
Jan-Patrick Schultheis
Also filed as: SCHULTHEIS JAN-PATRICK
8 granted patents·2 citations·filing 2018–2023
72Inventor score
Files withROHDE & SCHWARZ8
Top patents by PatentIndex Score
8 records- 0181US10768215B2Method of measuring the AM/PM conversion of a device under testROHDE & SCHWARZ·Filed 2018·Granted Sep 8, 2020·2 cites·20 claims
- 0256US11280871B2Method of absolute phase calibration as well as calibration systemROHDE & SCHWARZ·Filed 2019·Granted Mar 22, 2022·0 cites·14 claims
- 0355US12411166B2Measurement device for characterizing a device-under-testROHDE & SCHWARZ·Filed 2023·Granted Sep 9, 2025·0 cites·16 claims
- 0455US10996264B2Measurement method and device with compensation for a shifting frequencyROHDE & SCHWARZ·Filed 2018·Granted May 4, 2021·0 cites·16 claims
- 0548US11187736B2Method of setting an analyzer for testing a device under testROHDE & SCHWARZ·Filed 2020·Granted Nov 30, 2021·0 cites·23 claims
- 0647US11428770B2Method of calibrating a setupROHDE & SCHWARZ·Filed 2020·Granted Aug 30, 2022·0 cites·13 claims
- 0746US11054450B2Method of calibrating a measurement and analyzing device as well as method of measuring a frequency-converting device under testROHDE & SCHWARZ·Filed 2019·Granted Jul 6, 2021·0 cites·16 claims
- 0841US10890609B2Signal source, test system and method for testing a device under testROHDE & SCHWARZ·Filed 2018·Granted Jan 12, 2021·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →