Inventor · disambiguated record
Hiroshi Furuta
Also filed as: FURUTA HIROSHI
59 granted patents·9 pending applications·1,395 citations·filing 1992–2018
99Inventor score
Files withNEC ELECTRONICS CORP24RENESAS ELECTRONICS CORP10FURUTA HIROSHI8TOSHIBA KK7JVC KENWOOD CORP6
Top patents by PatentIndex Score
68 records- 0198US7993964B2Manufacturing method of semiconductor device including active layer of zinc oxide with controlled crystal lattice spacingKOCHI IND PROMOTION CT·Filed 2009·Granted Aug 9, 2011·214 cites·6 claims
- 0298US7598520B2Semiconductor device including active layer of zinc oxide with controlled crystal lattice spacing and manufacturing method thereofKOCHI IND PROMOTION CT·Filed 2007·Granted Oct 6, 2009·238 cites·19 claims
- 0398US7576394B2Thin film transistor including low resistance conductive thin films and manufacturing method thereofKOCHI IND PROMOTION CT·Filed 2007·Granted Aug 18, 2009·231 cites·15 claims
- 0497US7981734B2Manufacturing method of thin film transistor including low resistance conductive thin filmsKOCHI IND PROMOTION CT·Filed 2009·Granted Jul 19, 2011·90 cites·8 claims
- 0597US7977169B2Semiconductor device including active layer made of zinc oxide with controlled orientations and manufacturing method thereofKOCHI IND PROMOTION CT·Filed 2007·Granted Jul 12, 2011·125 cites·12 claims
- 0696US7989846B2Semiconductor device with three-dimensional field effect transistor structureRENESAS ELECTRONICS CORP·Filed 2008·Granted Aug 2, 2011·54 cites·21 claims
- 0790US7276956B2Integrated circuit apparatus controlling source voltage of MOSFET based on temperatureNEC ELECTRONICS CORP·Filed 2005·Granted Oct 2, 2007·22 cites·28 claims
- 0889US9319587B2Image pickup apparatus, image pickup method, and computer program productJVC KENWOOD CORP·Filed 2014·Granted Apr 19, 2016·14 cites·19 claims
- 0988US7772070B2Semiconductor integrated circuit device and dummy pattern arrangement methodNEC ELECTRONICS CORP·Filed 2007·Granted Aug 10, 2010·18 cites·19 claims
- 1087US7447950B2Memory device and memory error correction methodNEC ELECTRONICS CORP·Filed 2004·Granted Nov 4, 2008·39 cites·20 claims
- 1183US7973371B2Semiconductor integrated circuit device including static random access memory having diffusion layers for supplying potential to well regionRENESAS ELECTRONICS CORP·Filed 2008·Granted Jul 5, 2011·16 cites·16 claims
- 1282US7345346B2Field effect transistor having contact plugs in the source region greater than in the drain regionNEC ELECTRONICS CORP·Filed 2006·Granted Mar 18, 2008·12 cites·19 claims
- 1382US6335873B1Semiconductor integrated circuit deviceNEC CORP·Filed 2000·Granted Jan 1, 2002·40 cites·14 claims
- 1480US7816924B2Gas insulated switchgear and method for detecting arc damage in a gas insulated switchgear partTOSHIBA KK·Filed 2007·Granted Oct 19, 2010·9 cites·3 claims
- 1579US7561390B2Protection circuit in semiconductor circuit device comprising a plurality of chipsNEC ELECTRONICS CORP·Filed 2005·Granted Jul 14, 2009·10 cites·20 claims
- 1678US8546851B2Semiconductor integrated circuit deviceFURUTA HIROSHI·Filed 2011·Granted Oct 1, 2013·7 cites·12 claims
- 1778US5285096AHigh stability static memory device having metal-oxide semiconductor field-effect transistorsNEC CORP·Filed 1992·Granted Feb 8, 1994·42 cites·4 claims
- 1877US7897999B2Semiconductor integrated circuit deviceRENESAS ELECTRONICS CORP·Filed 2007·Granted Mar 1, 2011·5 cites·18 claims
- 1976US5416661ASemiconductor integrated circuit deviceNEC CORP·Filed 1993·Granted May 16, 1995·37 cites·9 claims
- 2075US8269126B2Gas insulated switchgear and method for detecting arc damage in a gas insulated switchgear partKANAZAWA YUKIO·Filed 2010·Granted Sep 18, 2012·3 cites·8 claims
- 2175US6538224B2Hybrid type gas insulation switch gear apparatusTOSHIBA KK·Filed 2001·Granted Mar 25, 2003·25 cites·6 claims
- 2274US8399954B2Semiconductor integrated circuit deviceFURUTA HIROSHI·Filed 2007·Granted Mar 19, 2013·6 cites·12 claims
- 2373US7808056B2Semiconductor integrated circuit deviceNEC ELECTRONICS CORP·Filed 2007·Granted Oct 5, 2010·6 cites·14 claims
- 2471US6936891B2Semiconductor memory device and manufacturing method thereforNEC ELECTRONICS CORP·Filed 2003·Granted Aug 30, 2005·22 cites·58 claims
- 2570US8004306B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2006·Granted Aug 23, 2011·6 cites·16 claims
- 2670US7274616B2Integrated circuit apparatusNEC ELECTRONICS CORP·Filed 2006·Granted Sep 25, 2007·8 cites·19 claims
- 2769US7940577B2Semiconductor integrated circuit device minimizing leakage currentRENESAS ELECTRONICS CORP·Filed 2006·Granted May 10, 2011·7 cites·15 claims
- 2866US9972342B2Terminal device and communication method for communication of speech signalsJVC KENWOOD CORP·Filed 2016·Granted May 15, 2018·2 cites·2 claims
- 2966US8169037B2Semiconductor integrated circuit including transistor having diffusion layer formed at outside of element isolation region for preventing soft errorFURUTA HIROSHI·Filed 2009·Granted May 1, 2012·3 cites·20 claims
- 3065US9997314B2Gas circuit breakerTOSHIBA KK·Filed 2016·Granted Jun 12, 2018·1 cites·12 claims
- 3165US7214989B2Semiconductor device and semiconductor integrated circuit deviceNEC ELECTRONICS CORP·Filed 2004·Granted May 8, 2007·13 cites·19 claims
- 3264US8552793B2Semiconductor deviceSHIMOGAWA KENJYU·Filed 2012·Granted Oct 8, 2013·2 cites·11 claims
- 3364US7743289B2Soft error rate calculation method and program, integrated circuit design method and apparatus, and integrated circuitNEC ELECTRONICS CORP·Filed 2007·Granted Jun 22, 2010·3 cites·19 claims
- 3464US6649853B2Combined type fluid pressure driving apparatusTOSHIBA KK·Filed 2001·Granted Nov 18, 2003·12 cites·15 claims
- 3563US7638849B2Semiconductor device having separated drain regionsNEC ELECTRONICS CORP·Filed 2006·Granted Dec 29, 2009·2 cites·10 claims
- 3663US6847561B2Semiconductor memory deviceNEC ELECTRONICS CORP·Filed 2003·Granted Jan 25, 2005·10 cites·15 claims
- 3762US8310297B2Semiconductor deviceSHIMOGAWA KENJYU·Filed 2011·Granted Nov 13, 2012·2 cites·10 claims
- 3858US6693250B2Hybrid gas insulation switchgear apparatusTOSHIBA KK·Filed 2002·Granted Feb 17, 2004·8 cites·6 claims
- 3957US8445951B2Semiconductor integrated circuit device including a fin-type field effect transistor and method of manufacturing the sameFURUTA HIROSHI·Filed 2012·Granted May 21, 2013·1 cites·10 claims
- 4056US7394688B2Nonvolatile memoryNEC ELECTRONICS CORP·Filed 2005·Granted Jul 1, 2008·3 cites·13 claims
- 4153US2009152609A1Semiconductor integrated circuit deviceNEC ELECTRONICS CORP·Filed 2009·Application pending·0 cites
- 4252US10418958B2Radio communication deviceJVC KENWOOD CORP·Filed 2018·Granted Sep 17, 2019·0 cites·6 claims
- 4352US5962599AMolding resin, composition containing the same, and process for producing themTOSOH CORP·Filed 1997·Granted Oct 5, 1999·13 cites·9 claims
- 4451US7473974B2Semiconductor circuit device including a protection circuitNEC ELECTRONICS CORP·Filed 2004·Granted Jan 6, 2009·4 cites·20 claims
- 4550US10164680B2Radio communication deviceJVC KENWOOD CORP·Filed 2018·Granted Dec 25, 2018·0 cites·4 claims
- 4650US6521855B2Hybrid gas insulation switchgear apparatusTOSHIBA KK·Filed 2001·Granted Feb 18, 2003·5 cites·15 claims
- 4750US2012228737A1Semiconductor integrated circuit deviceFURUTA HIROSHI·Filed 2012·Application pending·0 cites
- 4848US2010252911A1Semiconductor integrated circuit deviceNEC ELECTRONICS CORP·Filed 2010·Application pending·0 cites
- 4948US2006275995A1Semiconductor integrated circuit device and design method thereofNEC ELECTRONICS CORP·Filed 2006·Application pending·0 cites
- 5046US8054705B2Semiconductor integrated circuitRENESAS ELECTRONICS CORP·Filed 2009·Granted Nov 8, 2011·1 cites·3 claims
Showing the top 50 of 68 patent records by PatentIndex Score.
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