Inventor · disambiguated record
Chun-Ying Wang
Also filed as: WANG CHUN-YING · YANG CHUN
8 granted patents·2 pending applications·43 citations·filing 2005–2022
81Inventor score
Files withSHENZHEN FUTAIHONG PREC IND CO4TAIWAN SEMICONDUCTOR MFG CO LTD2LANREADY TECHNOLOGIES INC1SILICON MOTION INC1SIRF TECHNOLOGY HOLDINGS INC1
Top patents by PatentIndex Score
10 records- 0187US7639181B2Method and device for tracking weak global navigation satellite system (GNSS) signalsSIRF TECHNOLOGY HOLDINGS INC·Filed 2006·Granted Dec 29, 2009·33 cites·30 claims
- 0283US10008501B2Sandwich EPI channel for device enhancementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jun 26, 2018·3 cites·20 claims
- 0383US9466670B2Sandwich epi channel for device enhancementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Oct 11, 2016·5 cites·20 claims
- 0463US9287139B2Re-crystallization for boosting stress in MOS deviceTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Mar 15, 2016·1 cites·20 claims
- 0551US2008147782A1System and method for managing fixture calibration reportSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Application pending·0 cites
- 0649US12094727B2Method forming a semiconductor package deviceSILICON MOTION INC·Filed 2022·Granted Sep 17, 2024·0 cites·15 claims
- 0749US7594444B1Test apparatus and method therewithSHENZHEN FUTAIHONG PREC IND CO·Filed 2008·Granted Sep 29, 2009·1 cites·10 claims
- 0842US7966891B2Fatigue test apparatus for thin element of electronic deviceSHENZHEN FUTAIHONG PREC IND CO·Filed 2009·Granted Jun 28, 2011·0 cites·20 claims
- 0939US2009292498A1Resistance testing deviceSHENZHEN FUTAIHONG PREC IND CO·Filed 2009·Application pending·0 cites
- 1033US7209095B2Positioning structure for a dual-use antenna and baseLANREADY TECHNOLOGIES INC·Filed 2005·Granted Apr 24, 2007·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →