Inventor · disambiguated record
Cuong Le
Also filed as: LE CUONG · LE CUONG D · LE CUONG DUY · LE CUONG N
7 granted patents·9 pending applications·212 citations·filing 2000–2024
86Inventor score
Top patents by PatentIndex Score
16 records- 0188US6407546B1Non-contact technique for using an eddy current probe for measuring the thickness of metal layers disposed on semi-conductor wafer productsFiled 2000·Granted Jun 18, 2002·113 cites·17 claims
- 0281US6741076B2Eddy current measuring system for monitoring and controlling a CMP processFiled 2003·Granted May 25, 2004·31 cites·28 claims
- 0380US6549006B2Eddy current measurements of thin-film metal coatings using a selectable calibration standardFiled 2001·Granted Apr 15, 2003·30 cites·15 claims
- 0477US6762604B2Standalone eddy current measuring system for thickness estimation of conductive filmsFiled 2003·Granted Jul 13, 2004·26 cites·29 claims
- 0563US7019519B2Thickness estimation using conductively related calibration samplesLE CUONG DUY·Filed 2004·Granted Mar 28, 2006·12 cites·15 claims
- 0657US2025304863A1Hydrocarbon cracking process for converting renewable/circular feeds to lower olefinsSHELL USA INC·Filed 2024·Application pending·0 cites
- 0753US11744913B2Fluid conduit disinfectorBOLB INC·Filed 2020·Granted Sep 5, 2023·0 cites·10 claims
- 0853US2021085811A1Systems and methods for quantifying ultraviolet dosagesBOLB INC·Filed 2020·Application pending·0 cites
- 0952US11747008B2Deep ultraviolet light sourceBOLB INC·Filed 2021·Granted Sep 5, 2023·0 cites·18 claims
- 1045US2007240268A1Vibrating cleaning deviceLE CUONG N·Filed 2006·Application pending·0 cites
- 1139US2006215364A1Heatsink for high-power microprocessorsLE CUONG D·Filed 2005·Application pending·0 cites
- 1236US2003210041A1Eddy current measuring system for monitoring and controlling a chemical vapor deposition (CVD) processFiled 2003·Application pending·0 cites
- 1334US2003206008A1Eddy current measuring system for monitoring and controlling a physical vapor deposition(PVD) processFiled 2003·Application pending·0 cites
- 1434US2003206009A1Integrated eddy current measuring system for monitoring and controlling multiple semiconductor wafer fabrication processesFiled 2003·Application pending·0 cites
- 1534US2004070393A1Differential measurement method using eddy-current sensing to resolve a stack of conducting films on substratesFiled 2003·Application pending·0 cites
- 1633US2004207395A1Eddy current-capacitance sensor for conducting film characterizationFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →