Inventor · disambiguated record
Yung-Fa Chou
Also filed as: CHOU YUNG FA
22 granted patents·3 pending applications·232 citations·filing 1998–2014
95Inventor score
Files withTAIWAN SEMICONDUCTOR MFG7IND TECH RES INST6CHOU YUNG-FA4CHEN TING-SHENG2NAT UNIV TSING HUA2
Top patents by PatentIndex Score
25 records- 0193US8710676B2Stacked structure and stacked method for three-dimensional chipCHOU YUNG-FA·Filed 2011·Granted Apr 29, 2014·19 cites·14 claims
- 0291US6396731B1SRAM cell employing tunnel switched diodeTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted May 28, 2002·63 cites·19 claims
- 0380US8531199B2Method for testing through-silicon-via and the circuit thereofWU CHENG WEN·Filed 2010·Granted Sep 10, 2013·4 cites·5 claims
- 0480US6201435B1Low-power start-up circuit for a reference voltage generatorTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Mar 13, 2001·36 cites·5 claims
- 0577US8384201B2Wafer and method for improving yield rate of waferIND TECH RES INST·Filed 2009·Granted Feb 26, 2013·5 cites·18 claims
- 0675US8193006B2Method of chip repair by stacking a plurality of bad diesCHOU YUNG-FA·Filed 2009·Granted Jun 5, 2012·6 cites·9 claims
- 0773US6591384B1Comparable circuits for parallel testing DRAM deviceTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Jul 8, 2003·21 cites·14 claims
- 0867US9064549B2Memory deviceIND TECH RES INST·Filed 2014·Granted Jun 23, 2015·3 cites·27 claims
- 0967US7924083B2Isolation circuitIND TECH RES INST·Filed 2009·Granted Apr 12, 2011·5 cites·21 claims
- 1066US6060925ASchmitt-trigger circuit with low power consumptionTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted May 9, 2000·21 cites·15 claims
- 1165US8854853B2Technology of memory repair after stacking of three-dimensional integrated circuitCHOU YUNG-FA·Filed 2011·Granted Oct 7, 2014·3 cites·14 claims
- 1264US8217521B2Hardwired switch of die stack and operating method of hardwired switchCHEN TING-SHENG·Filed 2009·Granted Jul 10, 2012·2 cites·13 claims
- 1363US5909394APrecharge circuit for preventing invalid output pulses caused by current sensing circuits in flash memory devicesTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Jun 1, 1999·22 cites·20 claims
- 1462US8683276B2Apparatus and method for repairing an integrated circuitCHOU YUNG-FA·Filed 2012·Granted Mar 25, 2014·1 cites·26 claims
- 1562US8344520B2Stacked structure of chipsIND TECH RES INST·Filed 2012·Granted Jan 1, 2013·1 cites·9 claims
- 1658US6236598B1Clamping circuit for cell plate in DRAMTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted May 22, 2001·18 cites·20 claims
- 1755US8937486B2Method for testing through-silicon-viaNAT UNIV TSING HUA·Filed 2013·Granted Jan 20, 2015·0 cites·7 claims
- 1849US2011080184A1Method for testing through-silicon-via and the circuit thereofNAT UNIV TSING HUA·Filed 2009·Application pending·0 cites
- 1947US8026585B2Die stacking structure and fabricating method thereofIND TECH RES INST·Filed 2009·Granted Sep 27, 2011·0 cites·16 claims
- 2045US8912015B2Operating method of hardwired switchCHEN TING-SHENG·Filed 2012·Granted Dec 16, 2014·0 cites·6 claims
- 2144US9347981B2Test method for interposerIND TECH RES INST·Filed 2013·Granted May 24, 2016·0 cites·13 claims
- 2237US2015277096A1Display magnifying deviceKUO HUEI-JEN·Filed 2014·Application pending·0 cites
- 2334US9048342B2Semiconductor device stacked structureKWAI DING-MING·Filed 2012·Granted Jun 2, 2015·0 cites·21 claims
- 2434US2007133275A1Low-power reading reference circuit for split-gate flash memoryINTELLECTUAL PROPERTY LIBARARY·Filed 2006·Application pending·0 cites
- 2532US6204576B1High-voltage switch circuitTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Mar 20, 2001·2 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →