Inventor · disambiguated record
Sumio Ogawa
Also filed as: OGAWA SUMIO
19 granted patents·3 pending applications·194 citations·filing 1992–2019
94Inventor score
Top patents by PatentIndex Score
22 records- 0186US6349240B2Semiconductor device manufacturing system and method of manufacturing semiconductor devicesNEC CORP·Filed 2001·Granted Feb 19, 2002·41 cites·10 claims
- 0283US7952950B2Semiconductor device including anti-fuse circuit, and method of writing address to anti-fuse circuitELPIDA MEMORY INC·Filed 2008·Granted May 31, 2011·14 cites·26 claims
- 0383US6532182B2Semiconductor memory production system and semiconductor memory production methodNEC CORP·Filed 2001·Granted Mar 11, 2003·29 cites·12 claims
- 0481US7755163B2Antifuse element and semiconductor device including sameELPIDA MEMORY INC·Filed 2008·Granted Jul 13, 2010·10 cites·16 claims
- 0577US11294306B2Recording medium and recording deviceTOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORP·Filed 2019·Granted Apr 5, 2022·1 cites·9 claims
- 0676US7054705B2Method of manufacturing semiconductor devicesNEC ELECTRONICS CORP·Filed 2002·Granted May 30, 2006·19 cites·7 claims
- 0772US7550788B2Semiconductor device having fuse element arranged between electrodes formed in different wiring layersELPIDA MEMORY INC·Filed 2007·Granted Jun 23, 2009·5 cites·24 claims
- 0869US8179709B2Semiconductor device including antifuse elementOGAWA SUMIO·Filed 2008·Granted May 15, 2012·5 cites·18 claims
- 0964US6191987B1Semiconductor memory test circuitNEC CORP·Filed 2000·Granted Feb 20, 2001·11 cites·9 claims
- 1063US7613056B2Semiconductor memory deviceELPIDA MEMORY INC·Filed 2008·Granted Nov 3, 2009·4 cites·22 claims
- 1159US7359263B2Chip information managing method, chip information managing system, and chip information managing programELPIDA MEMORY INC·Filed 2006·Granted Apr 15, 2008·4 cites·17 claims
- 1258US5371707ADynamic random access memory device equipped with dummy cells implemented by enhancement type transistorsNEC CORP·Filed 1993·Granted Dec 6, 1994·17 cites·9 claims
- 1354US10366855B2Fuse element assembliesMICRON TECHNOLOGY INC·Filed 2017·Granted Jul 30, 2019·0 cites·10 claims
- 1449US9773632B2Fuse element assembliesMICRON TECHNOLOGY INC·Filed 2015·Granted Sep 26, 2017·0 cites·11 claims
- 1547US5570318ASemiconductor memory device incorporating redundancy memory cellsNEC CORP·Filed 1995·Granted Oct 29, 1996·11 cites·12 claims
- 1646US7868417B2Semiconductor device including a plurality of fuse elements and attenuation members between or around the plurality of fuse elementsELPIDA MEMORY INC·Filed 2008·Granted Jan 11, 2011·0 cites·19 claims
- 1745US2008179707A1Semiconductor device having a fuse elementELPIDA MEMORY INC·Filed 2008·Application pending·0 cites
- 1844US5318329AFlexible joint for an exhaust pipeTOYOTA MOTOR CO LTD·Filed 1992·Granted Jun 7, 1994·17 cites·16 claims
- 1943US2007235837A1Semiconductor device having fuse element and method of cutting fuse elementELPIDA MEMORY INC·Filed 2007·Application pending·0 cites
- 2043US2012199943A1Semiconductor device including antifuse elementOGAWA SUMIO·Filed 2012·Application pending·0 cites
- 2141US7417908B2Semiconductor storage deviceELPIDA MEMORY INC·Filed 2004·Granted Aug 26, 2008·2 cites·12 claims
- 2235US5485427ADynamic random access memory device equipped with dummy cells implemented by enhancement type transistorsNEC CORP·Filed 1994·Granted Jan 16, 1996·4 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →