Inventor · disambiguated record
Panagiotis Pieter Bintevinos
Also filed as: BINTEVINOS PANAGIOTIS PIETER
4 granted patents·9 citations·filing 2010–2023
68Inventor score
Top patents by PatentIndex Score
4 records- 0184US8749786B2Inspection method and apparatus, and corresponding lithographic apparatusFUCHS ANDREAS·Filed 2010·Granted Jun 10, 2014·5 cites·11 claims
- 0281US9470986B2Inspection methods, inspection apparatuses, and lithographic apparatusesASML NETHERLANDS BV·Filed 2014·Granted Oct 18, 2016·3 cites·16 claims
- 0370US11580274B2Method and apparatus for inspection and metrologyASML NETHERLANDS BV·Filed 2016·Granted Feb 14, 2023·1 cites·20 claims
- 0469US12204826B2Method and apparatus for inspection and metrologyASML NETHERLANDS BV·Filed 2023·Granted Jan 21, 2025·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →