Inventor · disambiguated record
Inna Patrick
Also filed as: PATRICK INNA · PATRICK INNA V
28 granted patents·3 pending applications·326 citations·filing 2002–2017
97Inventor score
Files withMICRON TECHNOLOGY INC17APTINA IMAGING CORP7HIMAX IMAGING INC2HIMAX IMAGING LTD2BRADY FREDERICK1
Top patents by PatentIndex Score
31 records- 0194US6897082B2Method of forming well for CMOS imagerMICRON TECHNOLOGY INC·Filed 2003·Granted May 24, 2005·54 cites·27 claims
- 0293US7009227B2Photodiode structure and image pixel structureMICRON TECHNOLOGY INC·Filed 2003·Granted Mar 7, 2006·59 cites·33 claims
- 0392US7768047B2Imager element, device and system with recessed transfer gateMICRON TECHNOLOGY INC·Filed 2007·Granted Aug 3, 2010·17 cites·28 claims
- 0492US7387908B2CMOS imager with enhanced transfer of charge and low voltage operation and method of formationMICRON TECHNOLOGY INC·Filed 2005·Granted Jun 17, 2008·14 cites·56 claims
- 0592US6921934B2Double pinned photodiode for CMOS APS and method of formationMICRON TECHNOLOGY INC·Filed 2003·Granted Jul 26, 2005·47 cites·49 claims
- 0689US7847366B2Well for CMOS imagerMICRON TECHNOLOGY INC·Filed 2009·Granted Dec 7, 2010·7 cites·9 claims
- 0787US7432121B2Isolation process and structure for CMOS imagersMICRON TECHNOLOGY INC·Filed 2005·Granted Oct 7, 2008·8 cites·16 claims
- 0886US7687832B2Method of fabricating a storage gate pixel designAPTINA IMAGING CORP·Filed 2006·Granted Mar 30, 2010·7 cites·21 claims
- 0986US7385232B2CMOS imager with enhanced transfer of charge and low voltage operation and method of formationMICRON TECHNOLOGY INC·Filed 2005·Granted Jun 10, 2008·7 cites·80 claims
- 1084US7718459B2Dual conversion gain pixel using Schottky and ohmic contacts to the floating diffusion region and methods of fabrication and operationAPTINA IMAGING CORP·Filed 2005·Granted May 18, 2010·8 cites·12 claims
- 1183US7749798B2Optimized photodiode process for improved transfer gate leakageAPTINA IMAGING CORP·Filed 2005·Granted Jul 6, 2010·6 cites·55 claims
- 1283US7511354B2Well for CMOS imager and method of formationMICRON TECHNOLOGY INC·Filed 2006·Granted Mar 31, 2009·4 cites·8 claims
- 1382US7635604B2Well for CMOS imager and method of formationMICRON TECHNOLOGY INC·Filed 2005·Granted Dec 22, 2009·4 cites·19 claims
- 1480US7153719B2Method of fabricating a storage gate pixel designMICRON TECHNOLOGY INC·Filed 2004·Granted Dec 26, 2006·21 cites·34 claims
- 1579US7078745B2CMOS imager with enhanced transfer of charge and low voltage operationMICRON TECHNOLOGY INC·Filed 2003·Granted Jul 18, 2006·18 cites·19 claims
- 1678US9070802B2Image sensor and fabricating method of image sensorHIMAX IMAGING INC·Filed 2014·Granted Jun 30, 2015·2 cites·8 claims
- 1778US7704782B2Method of forming pixel cells with color specific characteristicsAPTINA IMAGING CORP·Filed 2005·Granted Apr 27, 2010·4 cites·13 claims
- 1874US6767778B2Low dose super deep source/drain implantMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 27, 2004·17 cites·18 claims
- 1973US9653513B1CMOS image sensor and a method of forming the sameHIMAX IMAGING LTD·Filed 2016·Granted May 16, 2017·2 cites·9 claims
- 2073US7244646B2Pixel design to improve photodiode capacitance and method of forming sameMICRON TECHNOLOGY INC·Filed 2005·Granted Jul 17, 2007·2 cites·26 claims
- 2172US7829368B2Methods of forming double pinned photodiodesAPTINA IMAGING CORP·Filed 2009·Granted Nov 9, 2010·1 cites·26 claims
- 2272US7190041B2Well for CMOS imagerMICRON TECHNOLOGY INC·Filed 2005·Granted Mar 13, 2007·1 cites·21 claims
- 2371US7510900B2Methods of forming a double pinned photodiodeAPTINA IMAGING CORP·Filed 2006·Granted Mar 31, 2009·1 cites·25 claims
- 2463US9153621B2Process of forming a back side illumination image sensorHIMAX IMAGING INC·Filed 2014·Granted Oct 6, 2015·0 cites·9 claims
- 2563US7495273B2Double pinned photodiode for CMOS APS and method of formationAPTINA IMAGING CORP·Filed 2004·Granted Feb 24, 2009·6 cites·42 claims
- 2663US7420233B2Photodiode for improved transfer gate leakageMICRON TECHNOLOGY INC·Filed 2003·Granted Sep 2, 2008·8 cites·62 claims
- 2759US2009026511A1Isolation process and structure for CMOS imagersBRADY FREDERICK·Filed 2008·Application pending·0 cites
- 2848US2007246788A1N-well barrier pixels for improved protection of dark reference columns and rows from blooming and crosstalkMAURITZSON RICHARD A·Filed 2006·Application pending·0 cites
- 2946US2006255372A1Color pixels with anti-blooming isolation and method of formationMICRON TECHNOLOGY INC·Filed 2005·Application pending·0 cites
- 3043US10163965B1CMOS image sensor, a photodiode thereof and a method of forming the sameHIMAX IMAGING LTD·Filed 2017·Granted Dec 25, 2018·0 cites·6 claims
- 3142US8120109B2Low dose super deep source/drain implantWANG ZHONGZE·Filed 2004·Granted Feb 21, 2012·1 cites·54 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →