Inventor · disambiguated record
Tae-Sik Son
Also filed as: SON TAE-SIK
6 granted patents·55 citations·filing 2001–2010
81Inventor score
Top patents by PatentIndex Score
6 records- 0177US6657915B2Wordline driver for ensuring equal stress to wordlines in multi row address disturb test and method of driving the wordline driverSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Dec 2, 2003·37 cites·11 claims
- 0268US8656199B2Power-down method for system having volatile memory devicesCHO BEOM-SIG·Filed 2010·Granted Feb 18, 2014·3 cites·9 claims
- 0368US7616020B2Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Nov 10, 2009·5 cites·52 claims
- 0457US7476983B2Semiconductor device including wire bonding pads and pad layout methodSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jan 13, 2009·2 cites·18 claims
- 0555US7880493B2Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Feb 1, 2011·2 cites·20 claims
- 0647US6961282B2Semiconductor memory device with driving circuits for screening defective wordlines and related methodsSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Nov 1, 2005·6 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →