Inventor · disambiguated record
Clayton O. Ruud
Also filed as: RUUD CLAYTON · RUUD CLAYTON O
5 granted patents·192 citations·filing 1976–2001
83Inventor score
Top patents by PatentIndex Score
5 records- 0184US5148458AMethod and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffractionRUUD CLAYTON·Filed 1991·Granted Sep 15, 1992·66 cites·5 claims
- 0279US5414747AMethod and apparatus for in-process analysis of polycrystalline films and coatings by x-ray diffractionPENN STATE RES FOUND·Filed 1994·Granted May 9, 1995·52 cites·21 claims
- 0379US4686631AMethod for determining internal stresses in polycrystalline solidsRUUD CLAYTON O·Filed 1985·Granted Aug 11, 1987·56 cites·12 claims
- 0465US6493420B2Apparatus and method for in-situ measurement of residual surface stressesPENN STATE RES FOUND·Filed 2001·Granted Dec 10, 2002·7 cites·26 claims
- 0549US4042825AStressed-unstressed standard for X-ray stress analysis and method of making sameCOLORADO SEMINARY·Filed 1976·Granted Aug 16, 1977·11 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →