Inventor · disambiguated record
Eckhard Marx
Also filed as: MARX ECKHARD
7 granted patents·2 pending applications·40 citations·filing 1998–2004
81Inventor score
Files withINFINEON TECHNOLOGIES AG3FREESCALE SEMICONDUCTOR INC1INFINEON TECHNOLOGIES SC3001INFINEON TECHNOLOGIES SG300 GM1NANOPHOTONICS AG1
Top patents by PatentIndex Score
9 records- 0167US6745637B2Self-supporting adaptable metrology deviceINFINEON TECHNOLOGIES SC300·Filed 2002·Granted Jun 8, 2004·13 cites·22 claims
- 0260US6935201B2Measurement configuration including a vehicle and method for performing measurements with the measurement configuration at various locationsNANOPHOTONICS AG·Filed 2003·Granted Aug 30, 2005·8 cites·22 claims
- 0357US6914006B2Wafer scribing method and wafer scribing deviceFREESCALE SEMICONDUCTOR INC·Filed 2001·Granted Jul 5, 2005·6 cites·4 claims
- 0456US6261382B1Wafer markingINFINEON TECHNOLOGIES AG·Filed 2000·Granted Jul 17, 2001·8 cites·4 claims
- 0548US6866200B2Semiconductor device identification apparatusINFINEON TECHNOLOGIES SG300 GM·Filed 2004·Granted Mar 15, 2005·5 cites·28 claims
- 0645US7262837B2Noninvasive method for characterizing and identifying embedded micropatternsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Aug 28, 2007·0 cites·7 claims
- 0733US2004117055A1Configuration and method for detecting defects on a substrate in a processing toolFiled 2003·Application pending·0 cites
- 0827US6147321AConfiguration for the automatic inscription or reinscription of wafersINFINEON TECHNOLOGIES AG·Filed 1998·Granted Nov 14, 2000·0 cites·3 claims
- 0926US2002058345A1Apparatus and method for removing an organic material from a semiconductor deviceFiled 2001·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Eckhard Marx files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →