Inventor · disambiguated record
Sang-Jib Han
Also filed as: HAN SANG-JIB
14 granted patents·141 citations·filing 1997–2009
91Inventor score
Files withSAMSUNG ELECTRONICS CO LTD14
Top patents by PatentIndex Score
14 records- 0186US6275437B1Refresh-type memory with zero write recovery time and no maximum cycle timeSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Aug 14, 2001·45 cites·28 claims
- 0283US6256254B1Semiconductor memory device decoderSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Jul 3, 2001·37 cites·14 claims
- 0378US6463002B2Refresh-type memory with zero write recovery time and no maximum cycle timeSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Oct 8, 2002·24 cites·7 claims
- 0468US7663217B2Semiconductor device packageSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Feb 16, 2010·4 cites·20 claims
- 0563US7541612B2Multi-chip package semiconductor device and method of detecting a failure thereofSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jun 2, 2009·2 cites·8 claims
- 0659US6510094B2Method and apparatus for refreshing semiconductor memorySAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Jan 21, 2003·12 cites·20 claims
- 0755US6490223B1Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Dec 3, 2002·7 cites·15 claims
- 0853US8039274B2Multi-chip package semiconductor device and method of detecting a failure thereofSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Oct 18, 2011·0 cites·3 claims
- 0953US7486532B2Semiconductor multi-chip package including two semiconductor memory chips having different memory densitiesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Feb 3, 2009·2 cites·25 claims
- 1048US7154790B2Multi-chip semiconductor packages and methods of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Dec 26, 2006·5 cites·30 claims
- 1134US6816429B2Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Nov 9, 2004·0 cites·12 claims
- 1233US6288926B1Static semiconductor memory device and fabricating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Sep 11, 2001·0 cites·5 claims
- 1333US6271705B1Data output circuits having enhanced ESD resistance and related methodsSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Aug 7, 2001·2 cites·42 claims
- 1431US5994943AData output circuits having enhanced ESD resistance and related methodsSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Nov 30, 1999·1 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →