Inventor · disambiguated record
Claire E. Staniunas
Also filed as: STANIUNAS CLAIRE · STANIUNAS CLAIRE E
3 granted patents·2 citations·filing 2017–2018
49Inventor score
Files withKLA TENCOR CORP3
Top patents by PatentIndex Score
3 records- 0167US10817999B2Image-based overlay metrology and monitoring using through-focus imagingKLA TENCOR CORP·Filed 2018·Granted Oct 27, 2020·2 cites·25 claims
- 0243US10565697B2Utilizing overlay misregistration error estimations in imaging overlay metrologyKLA TENCOR CORP·Filed 2017·Granted Feb 18, 2020·0 cites·22 claims
- 0339US10379449B2Identifying process variations during product manufactureKLA TENCOR CORP·Filed 2018·Granted Aug 13, 2019·0 cites·17 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →