Inventor · disambiguated record
Szetsen Steven Lee
Also filed as: LEE SZETSEN · LEE SZETSEN S · LEE SZETSEN STEVEN
12 granted patents·4 pending applications·92 citations·filing 1998–2017
89Inventor score
Files withWINBOND ELECTRONICS CORP9UNIV CHUNG YUAN CHRISTIAN3LEE SZETSEN STEVEN1WINDBOND ELECTRONICS CORP1
Top patents by PatentIndex Score
16 records- 0176US6021672ASimultaneous in-situ optical sensing of pressure and etch rate in plasma etch chamberWINDBOND ELECTRONICS CORP·Filed 1998·Granted Feb 8, 2000·30 cites·18 claims
- 0271US6440865B1Method of profile control in metal etchingWINBOND ELECTRONICS CORP·Filed 2000·Granted Aug 27, 2002·16 cites·19 claims
- 0363US6052183AIn-situ particle monitoringWINBOND ELECTRONICS CORP·Filed 1999·Granted Apr 18, 2000·26 cites·10 claims
- 0462US6450683B1Optical temperature measurement as an in situ monitor of etch rateWINBOND ELECTRONICS CORP·Filed 2000·Granted Sep 17, 2002·5 cites·14 claims
- 0557US6444401B1Fabrication of field emitting tipsWINBOND ELECTRONICS CORP·Filed 2000·Granted Sep 3, 2002·3 cites·4 claims
- 0655US7663126B2Ion implantation system and method of monitoring implant energy of an ion implantation deviceUNIV CHUNG YUAN CHRISTIAN·Filed 2008·Granted Feb 16, 2010·0 cites·5 claims
- 0749US6064145AFabrication of field emitting tipsWINBOND ELECTRONICS CORP·Filed 1999·Granted May 16, 2000·7 cites·15 claims
- 0847US6732295B2Method and system of frequency modulated end-point detectionWINBOND ELECTRONICS CORP·Filed 2000·Granted May 4, 2004·2 cites·16 claims
- 0946US2006121707A1Ion implantation system and method of monitoring implant energy of an ion implantation deviceUNIV CHUNG YUAN CHRISTIAN·Filed 2005·Application pending·0 cites
- 1043US6628384B2Spectroscopic method and related apparatus for measuring electrode gap distanceWINBOND ELECTRONICS CORP·Filed 2001·Granted Sep 30, 2003·2 cites·17 claims
- 1142US9939445B1Detection method for cancer cell in vitro and system using the sameUNIV CHUNG YUAN CHRISTIAN·Filed 2017·Granted Apr 10, 2018·0 cites·20 claims
- 1239US7001530B2Method for detecting the end point by using matrixWINBOND ELECTRONICS CORP·Filed 2003·Granted Feb 21, 2006·0 cites·14 claims
- 1339US6932944B2High efficiency scrubber for waste gas abatementWINBOND ELECTRONICS CORP·Filed 2001·Granted Aug 23, 2005·1 cites·8 claims
- 1436US2004110384A1Detecting method for dry etching machineFiled 2003·Application pending·0 cites
- 1534US2002039818A1Wavy-shaped deep trench and method of formingFiled 2001·Application pending·0 cites
- 1625US2012282733A1Method for band gap tuning of metal oxide semiconductorsLEE SZETSEN STEVEN·Filed 2011·Application pending·0 cites
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