Inventor · disambiguated record
Roy E. Swart
Also filed as: SWART ROY · SWART ROY E
10 granted patents·2 pending applications·24 citations·filing 2001–2021
83Inventor score
Top patents by PatentIndex Score
12 records- 0187US11156637B2Electrical test probes having decoupled electrical and mechanical designFORMFACTOR INC·Filed 2019·Granted Oct 26, 2021·4 cites·15 claims
- 0280US9360502B2Increasing current carrying capability through direct liquid cooling of test contactsCRIPPEN WARREN S·Filed 2011·Granted Jun 7, 2016·7 cites·23 claims
- 0369US8513966B2Probes formed from semiconductor region viasMA QING·Filed 2010·Granted Aug 20, 2013·2 cites·10 claims
- 0460US9835648B2Liquid metal interconnectsBASKARAN RAJASHREE·Filed 2011·Granted Dec 5, 2017·1 cites·13 claims
- 0557US10627427B2Manufacturing advanced test probesINTEL CORP·Filed 2017·Granted Apr 21, 2020·0 cites·10 claims
- 0652US12113583B2Beamforming device testingFORMFACTOR INC·Filed 2021·Granted Oct 8, 2024·0 cites·12 claims
- 0752US9279830B2Test probe structures and methods including positioning test probe structures in a test headSWART ROY E·Filed 2011·Granted Mar 8, 2016·1 cites·15 claims
- 0848US6919050B2Method and arrangement for supplying a waste heat exchanger with exhaust gas from a gas turbineNEM POWER SYSTEMS·Filed 2001·Granted Jul 19, 2005·9 cites·8 claims
- 0938US9391447B2Interposer to regulate current for wafer test toolingFLEDELL EVAN M·Filed 2012·Granted Jul 12, 2016·0 cites·20 claims
- 1038US2015008950A1Manufacturing advanced test probesSWART ROY E·Filed 2011·Application pending·0 cites
- 1136US2017330677A1Space transformers, planarization layers for space transformers, methods of fabricating space transformers, and methods of planarizing space transformersCASCADE MICROTECH INC·Filed 2016·Application pending·0 cites
- 1235US10120020B2Probe head assemblies and probe systems for testing integrated circuit devicesCASCADE MICROTECH INC·Filed 2016·Granted Nov 6, 2018·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →