Inventor · disambiguated record
Youngjung Lee
Also filed as: LEE YOUNGJUNG
3 granted patents·3 pending applications·4 citations·filing 2018–2018
57Inventor score
Top patents by PatentIndex Score
6 records- 0187US10793969B2Sample rod growth and resistivity measurement during single crystal silicon ingot productionGLOBAL WAFERS CO LTD·Filed 2018·Granted Oct 6, 2020·2 cites·18 claims
- 0283US10781532B2Methods for determining the resistivity of a polycrystalline silicon meltGLOBAL WAFERS CO LTD·Filed 2018·Granted Sep 22, 2020·1 cites·19 claims
- 0365US11124893B2Method of treating a single crystal silicon ingot to improve the LLS ring/core patternGLOBALWAFERS CO LTD·Filed 2018·Granted Sep 21, 2021·1 cites·29 claims
- 0449US2020199773A1Center Slab Lapping and Resistivity Measurement During Single Crystal Silicon Ingot ProductionGLOBALWAFERS CO LTD·Filed 2018·Application pending·0 cites
- 0549US2020199775A1Sample Rod Center Slab Resistivity Measurement During Single Crystal Silicon Ingot ProductionGLOBALWAFERS CO LTD·Filed 2018·Application pending·0 cites
- 0649US2020199774A1Sample Rod Center Slab Resistivity Measurement With Four-Point Probe During Single Crystal Silicon Ingot ProductionGLOBALWAFERS CO LTD·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →