Inventor · disambiguated record

Debra L. Meunier

Also filed as: MEUNIER DEBRA L

2 granted patents·91 citations·filing 2000–2001

61Inventor score

Technology areasH01J H10P

Files withIBM2

Top patents by PatentIndex Score

2 records

0191US6350548B1Nested overlay measurement targetIBM·Filed 2000·Granted Feb 26, 2002·90 cites·22 claims
0245US6683306B2Array foreshortening measurement using a critical dimension scanning electron microscopeIBM·Filed 2001·Granted Jan 27, 2004·1 cites·18 claims

Join the waitlist — get patent alerts

Get an alert when Debra L. Meunier files or is granted a new patent.

We store only your email — no account needed. See our privacy policy.

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →