Inventor · disambiguated record
Reginald R. Bowley, Jr.
Also filed as: BOWLEY JR REGINALD R
4 granted patents·30 citations·filing 1999–2004
74Inventor score
Files withIBM4
Top patents by PatentIndex Score
4 records- 0167US6944578B2Contact hole profile and line edge width metrology for critical image control and feedback of lithographic focusIBM·Filed 2004·Granted Sep 13, 2005·9 cites·6 claims
- 0265US6917901B2Contact hole profile and line edge width metrology for critical image control and feedback of lithographic focusIBM·Filed 2002·Granted Jul 12, 2005·8 cites·26 claims
- 0352US6414308B1Method for determining opened/unopened semiconductor contacts using a scanning electron microscopeIBM·Filed 1999·Granted Jul 2, 2002·12 cites·20 claims
- 0445US6683306B2Array foreshortening measurement using a critical dimension scanning electron microscopeIBM·Filed 2001·Granted Jan 27, 2004·1 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →