Inventor · disambiguated record
Seizi Huzino
Also filed as: HUZINO SEIZI
18 granted patents·700 citations·filing 1981–1994
96Inventor score
Top patents by PatentIndex Score
18 records- 0199US4489695AMethod and system for output control of internal combustion engineNIPPON SOKEN·Filed 1982·Granted Dec 25, 1984·183 cites·6 claims
- 0299US4434767AOutput control system for multicylinder internal combustion engineNIPPON SOKEN·Filed 1981·Granted Mar 6, 1984·177 cites·6 claims
- 0390US4912975ADirect-heated flow measuring apparatus having improved response characteristicsNIPPON SOKEN·Filed 1989·Granted Apr 3, 1990·32 cites·14 claims
- 0488US4840067ASemiconductor pressure sensor with method diaphragmNIPPON SOKEN·Filed 1987·Granted Jun 20, 1989·50 cites·8 claims
- 0582US4986861ASemiconductor pressure sensor and method for bonding semiconductor chip to metal diaphragm thereofNIPPON SOKEN·Filed 1989·Granted Jan 22, 1991·36 cites·9 claims
- 0670US4843882ADirect-heated flow measuring apparatus having improved sensitivity response speedNIPPON SOKEN·Filed 1988·Granted Jul 4, 1989·25 cites·13 claims
- 0769US4700127AMicrowave probe and rotary body detecting apparatus using the sameNIPPON SOKEN·Filed 1985·Granted Oct 13, 1987·19 cites·7 claims
- 0868US4983469AThin film electroluminescent elementNIPPON SOKEN·Filed 1989·Granted Jan 8, 1991·23 cites·10 claims
- 0964US4785662ADirect-heated gas-flow measuring apparatusNIPPON SOKEN·Filed 1986·Granted Nov 22, 1988·22 cites·19 claims
- 1063US5204282ASemiconductor circuit structure and method for making the sameNIPPON SOKEN·Filed 1990·Granted Apr 20, 1993·34 cites·13 claims
- 1162US4870860ADirect-heated flow measuring apparatus having improved response characteristicsNIPPON SOKEN·Filed 1988·Granted Oct 3, 1989·17 cites·25 claims
- 1261US4627279ADirect-heated gas-flow measuring apparatusNIPPON SOKEN·Filed 1985·Granted Dec 9, 1986·19 cites·13 claims
- 1348US4992846APolycrystalline silicon active layer for good carrier mobilityNIPPON SOKEN·Filed 1990·Granted Feb 12, 1991·19 cites·4 claims
- 1443US4688425ADirect-heated flow measuring apparatus having film resistorNIPPON SOKEN·Filed 1986·Granted Aug 25, 1987·9 cites·17 claims
- 1542US5461253ASemiconductor substrate structure for producing two isolated circuits on a same substrateNIPPON SOKEN·Filed 1994·Granted Oct 24, 1995·12 cites·19 claims
- 1642US4735099ADirect-heated gas-flow measuring apparatusNIPPON SOKEN·Filed 1986·Granted Apr 5, 1988·8 cites·22 claims
- 1740US4756190ADirect-heated flow measuring apparatus having uniform characteristicsNIPPON SOKEN·Filed 1986·Granted Jul 12, 1988·7 cites·15 claims
- 1835US5153700ACrystal-etched matching faces on semiconductor chip and supporting semiconductor substrateNIPPON DENSO CO·Filed 1991·Granted Oct 6, 1992·8 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →