Inventor · disambiguated record
Hokei Lam
Also filed as: LAM HOKEI
5 granted patents·1 citations·filing 2011–2013
60Inventor score
Top patents by PatentIndex Score
5 records- 0148US8664950B2Method for measuring longitudinal bias magnetic field in a tunnel magnetoresistive sensorMOK SIUMAN·Filed 2011·Granted Mar 4, 2014·1 cites·4 claims
- 0244US9355660B2Testing method of a magnetic head, and testing apparatus thereofSAE MAGNETICS HK LTD·Filed 2013·Granted May 31, 2016·0 cites·12 claims
- 0337US9121888B2Method of testing anti-high temperature performance of a magnetic head and apparatus thereofLUENG CHIUMING·Filed 2011·Granted Sep 1, 2015·0 cites·32 claims
- 0435US8935132B2Spectral simulation method during noise testing for a magnetic head, and noise-testing method for a magnetic head by using the sameLAM HOKEI·Filed 2012·Granted Jan 13, 2015·0 cites·21 claims
- 0532US9899046B2Method of testing anti-high temperature performance of a magnetic head and apparatus thereofLUI CHEUKMAN·Filed 2011·Granted Feb 20, 2018·0 cites·42 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →