Inventor · disambiguated record
Martin Verheijen
Also filed as: VERHEIJEN MARTIN
3 granted patents·1 pending application·6 citations·filing 2011–2022
57Inventor score
Top patents by PatentIndex Score
4 records- 0185US10937625B2Method of imaging a sample using an electron microscopeFEI CO·Filed 2019·Granted Mar 2, 2021·4 cites·19 claims
- 0260US8757873B2Method of measuring the temperature of a sample carrier in a charged particle-optical apparatusVAN DEN BOOM STEPHANUS HUBERTUS LEONARDUS·Filed 2011·Granted Jun 24, 2014·2 cites·17 claims
- 0350US2023184696A1Thermal drift correction based on thermal modelingFEI CO·Filed 2022·Application pending·0 cites
- 0427US9396907B2Method of calibrating a scanning transmission charged-particle microscopeFEI CO·Filed 2015·Granted Jul 19, 2016·0 cites·14 claims
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