Inventor · disambiguated record
Go Fujinawa
Also filed as: FUJINAWA GO
8 granted patents·170 citations·filing 1999–2017
88Inventor score
Files withRIGAKU DENKI CO LTD8
Top patents by PatentIndex Score
8 records- 0189US6807251B2X-ray diffraction apparatusRIGAKU DENKI CO LTD·Filed 2002·Granted Oct 19, 2004·56 cites·7 claims
- 0281US7542548B2X-ray optical systemRIGAKU DENKI CO LTD·Filed 2007·Granted Jun 2, 2009·18 cites·7 claims
- 0378US7860217B2X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the sameRIGAKU DENKI CO LTD·Filed 2008·Granted Dec 28, 2010·6 cites·14 claims
- 0475US6917667B2Method and apparatus for making parallel X-ray beam and X-ray diffraction apparatusRIGAKU DENKI CO LTD·Filed 2003·Granted Jul 12, 2005·20 cites·9 claims
- 0573US6990177B2X-ray optical system for small angle scatteringRIGAKU DENKI CO LTD·Filed 2003·Granted Jan 24, 2006·13 cites·4 claims
- 0672US6307917B1Soller slit and X-ray apparatusRIGAKU DENKI CO LTD·Filed 1999·Granted Oct 23, 2001·29 cites·5 claims
- 0769US6266392B1Soller slit and manufacturing method of the sameRIGAKU DENKI CO LTD·Filed 1999·Granted Jul 24, 2001·28 cites·10 claims
- 0841US11300529B2Analysis apparatus, analysis method and analysis programRIGAKU DENKI CO LTD·Filed 2017·Granted Apr 12, 2022·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →