Inventor · disambiguated record
Carl Barnhart
Also filed as: BARNHART CARL · BARNHART CARL F · BARNHART CARL FREDERICK
10 granted patents·1 pending application·210 citations·filing 1978–2008
90Inventor score
Top patents by PatentIndex Score
11 records- 0193US6611933B1Real-time decoder for scan test patternsIBM·Filed 2000·Granted Aug 26, 2003·83 cites·16 claims
- 0287US6567943B1D flip-flop structure with flush path for high-speed boundary scan applicationsIBM·Filed 2000·Granted May 20, 2003·41 cites·27 claims
- 0385US7979764B2Distributed test compression for integrated circuitsCADENCE DESIGN SYSTEMS INC·Filed 2007·Granted Jul 12, 2011·16 cites·21 claims
- 0470US6185710B1High-performance IEEE1149.1-compliant boundary scan cellIBM·Filed 1998·Granted Feb 6, 2001·32 cites·22 claims
- 0566US7305600B2Partial good integrated circuit and method of testing sameIBM·Filed 2003·Granted Dec 4, 2007·11 cites·19 claims
- 0665US6795944B2Testing regularly structured logic circuits in integrated circuit devicesIBM·Filed 2001·Granted Sep 21, 2004·13 cites·14 claims
- 0756US7478301B2Partial good integrated circuit and method of testing sameIBM·Filed 2008·Granted Jan 13, 2009·2 cites·9 claims
- 0856US6804803B2Method for testing integrated logic circuitsIBM·Filed 2001·Granted Oct 12, 2004·5 cites·25 claims
- 0954US7434129B2Partial good integrated circuit and method of testing sameIBM·Filed 2007·Granted Oct 7, 2008·3 cites·11 claims
- 1038US4205303APerforming arithmetic using indirect digital-to-analog conversionIBM·Filed 1978·Granted May 27, 1980·4 cites·7 claims
- 1134US2004139377A1Method and apparatus for compact scan testingIBM·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →