Inventor · disambiguated record
Dorothea Maria Christina Oorschot
Also filed as: OORSCHOT DOROTHEA MARIA CHRISTINA
3 granted patents·12 citations·filing 2008–2020
57Inventor score
Top patents by PatentIndex Score
3 records- 0184US7992115B2Overlay measurement on double patterning substrateASML NETHERLANDS BV·Filed 2008·Granted Aug 2, 2011·12 cites·9 claims
- 0251US11668661B2Inspection tool and inspection methodASML NETHERLANDS BV·Filed 2020·Granted Jun 6, 2023·0 cites·10 claims
- 0336US8119333B2Lithographic methodVAN DER HEIJDEN EDDY CORNELIS ANTONIUS·Filed 2008·Granted Feb 21, 2012·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →