Inventor · disambiguated record
Chung Wah See
Also filed as: SEE CHUNG W · SEE CHUNG WAH
5 granted patents·1 pending application·38 citations·filing 1987–2013
78Inventor score
Top patents by PatentIndex Score
6 records- 0166US9470629B2Surface plasmon microscopyUNIV NOTTINGHAM·Filed 2013·Granted Oct 18, 2016·1 cites·18 claims
- 0256US7142308B2MicroscopyUNIV NOTTINGHAM·Filed 2001·Granted Nov 28, 2006·3 cites·41 claims
- 0349US4873434AScanning optical microscope using single laser beamNAT RES DEV·Filed 1987·Granted Oct 10, 1989·14 cites·9 claims
- 0439US5139336AOptical measuring apparatus using amplitude modulation of slipt beamsNAT RES DEV·Filed 1989·Granted Aug 18, 1992·7 cites·7 claims
- 0538US5579108ASystem and method for detecting the angle of a light beam using a mask with a transmissivity patternRANK TAYLOR HOBSON LTD·Filed 1993·Granted Nov 26, 1996·13 cites·11 claims
- 0629US2006098861A1Image analysis method, apparatus and softwareSEE CHUNG W·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →