Inventor · disambiguated record
David L. Grant
Also filed as: GRANT DAVID · GRANT DAVID L · GRANT DAVID LEE
20 granted patents·6 pending applications·1,007 citations·filing 1988–2016
96Inventor score
Files withCOMPAQ COMPUTER CORP8MARX DAVID S4HEWLETT PACKARD DEVELOPMENT CO2RUDOLPH TECH INC2TAMAR TECHNOLOGY INC2
Top patents by PatentIndex Score
26 records- 0193US7477401B2Trench measurement system employing a chromatic confocal height sensor and a microscopeTAMAR TECHNOLOGY INC·Filed 2005·Granted Jan 13, 2009·57 cites·10 claims
- 0292US5249279AMethod for controlling disk array operations by receiving logical disk requests and translating the requests to multiple physical disk specific commandsCOMPAQ COMPUTER CORP·Filed 1989·Granted Sep 28, 1993·145 cites·11 claims
- 0391US6209023B1Supporting a SCSI device on a non-SCSI transport medium of a networkCOMPAQ COMPUTER CORP·Filed 1999·Granted Mar 27, 2001·265 cites·66 claims
- 0489US7738113B1Wafer measurement system and apparatusTAMAR TECHNOLOGY INC·Filed 2007·Granted Jun 15, 2010·29 cites·9 claims
- 0586US5592648AMethod for developing physical disk drive specific commands from logical disk access commands for use in a disk arrayCOMPAQ COMPUTER CORP·Filed 1993·Granted Jan 7, 1997·93 cites·11 claims
- 0685US5440716AMethod for developing physical disk drive specific commands from logical disk access commands for use in a disk arrayCOMPAQ COMPUTER CORP·Filed 1993·Granted Aug 8, 1995·89 cites·4 claims
- 0781US6505268B1Data distribution in a disk arrayCOMPAQ COMPUTER CORP·Filed 1999·Granted Jan 7, 2003·98 cites·7 claims
- 0876US9714825B2Wafer shape thickness and trench measurementMARX DAVID S·Filed 2011·Granted Jul 25, 2017·5 cites·19 claims
- 0976US5909691AMethod for developing physical disk drive specific commands from logical disk access commands for use in a disk arrayCOMPAQ COMPUTER CORP·Filed 1996·Granted Jun 1, 1999·61 cites·11 claims
- 1074US6295578B1Cascaded removable media data storage systemCOMPAQ COMPUTER CORP·Filed 1999·Granted Sep 25, 2001·60 cites·19 claims
- 1170US9457446B2Methods and systems for use in grind shape control adaptationSTRASBAUGH·Filed 2013·Granted Oct 4, 2016·2 cites·3 claims
- 1268US8649016B2System for directly measuring the depth of a high aspect ratio etched feature on a waferMARX DAVID S·Filed 2011·Granted Feb 11, 2014·2 cites·33 claims
- 1366US7850579B2Bilateral arm trainer and method of useUNIV MARYLAND·Filed 2006·Granted Dec 14, 2010·7 cites·21 claims
- 1463US7121981B2Bilateral arm trainer and method of useUNIV MARYLAND·Filed 2001·Granted Oct 17, 2006·14 cites·31 claims
- 1558US6842833B1Computer system and method for transferring data between multiple peer-level storage unitsHEWLETT PACKARD DEVELOPMENT CO·Filed 1998·Granted Jan 11, 2005·44 cites·36 claims
- 1657US5066482ACompositions and method for controlling cockroachesSANDOZ LTD·Filed 1990·Granted Nov 19, 1991·9 cites·10 claims
- 1755US9587932B2System for directly measuring the depth of a high aspect ratio etched feature on a waferRUDOLPH TECH INC·Filed 2016·Granted Mar 7, 2017·0 cites·15 claims
- 1855US6710864B1Concentricity measuring instrument for a fiberoptic cable endFiled 2003·Granted Mar 23, 2004·7 cites·14 claims
- 1954US4941059AMethod for restoring computer files, including improved steps for location of head clusters of filesCOMPAQ COMPUTER CORP·Filed 1988·Granted Jul 10, 1990·20 cites·1 claims
- 2054US2014110582A1System for directly measuring the depth of a high aspect ratio etched feature on a waferRUDOLPH TECHNOLOGIES INC·Filed 2013·Application pending·0 cites
- 2149US2009043169A1Childbirth instrument and methodIMS LAUNCH LLC·Filed 2008·Application pending·0 cites
- 2244US2016147271A1Powering nodesHEWLETT PACKARD DEVELOPMENT CO·Filed 2013·Application pending·0 cites
- 2343US9952041B2Assessing alignment of top and bottom ends of TSVs and characterizing microfabrication processRUDOLPH TECH INC·Filed 2014·Granted Apr 24, 2018·0 cites·9 claims
- 2443US2007148792A1Wafer measurement system and apparatusMARX DAVID S·Filed 2006·Application pending·0 cites
- 2542US2001047462A1Cascaded removable media data storage systemFiled 2001·Application pending·0 cites
- 2639US2010321671A1System for directly measuring the depth of a high aspect ratio etched feature on a waferMARX DAVID S·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →