Inventor · disambiguated record
Tero Eklin
Also filed as: EKLIN TERO
3 granted patents·1 pending application·53 citations·filing 2003–2006
69Inventor score
Files withOXFORD INSTR ANALYTICAL OY3
Top patents by PatentIndex Score
4 records- 0190US7233643B2Measurement apparatus and method for determining the material composition of a sample by combined X-ray fluorescence analysis and laser-induced breakdown spectroscopyOXFORD INSTR ANALYTICAL OY·Filed 2005·Granted Jun 19, 2007·43 cites·21 claims
- 0277US7426019B2Method and arrangement for non-destructive composition analysis of delicate samplesOXFORD INSTR ANALYTICAL OY·Filed 2006·Granted Sep 16, 2008·8 cites·23 claims
- 0341US6934021B2Method and arrangement for applying optical emission spectroscopy to the detection of the 193 nm spectral line of carbonOXFORD INSTR ANALYTICAL OY·Filed 2003·Granted Aug 23, 2005·2 cites·16 claims
- 0437US2004051866A1Method and arrangement for applying optical emission spectroscopy to the detection of the 193 nm spectral line of carbonFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →