Inventor · disambiguated record
Wallace E. Fister
Also filed as: FISTER WALLACE · FISTER WALLACE E
17 granted patents·746 citations·filing 1997–2013
95Inventor score
Technology areasG11C
Top patents by PatentIndex Score
17 records- 0198US5935263AMethod and apparatus for memory array compressed data testingMICRON TECHNOLOGY INC·Filed 1997·Granted Aug 10, 1999·503 cites·36 claims
- 0295US6452868B1Method for generating memory addresses for accessing memory-cell arrays in memory devicesMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 17, 2002·78 cites·39 claims
- 0390US8687435B2System and method for reducing pin-count of memory devices, and memory device testers for sameMICRON TECHNOLOGY INC·Filed 2013·Granted Apr 1, 2014·9 cites·20 claims
- 0484US6324657B1On-clip testing circuit and method for improving testing of integrated circuitsMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 27, 2001·56 cites·64 claims
- 0582US6327199B1Method for testing memory devicesMICRON TECHNOLOGY INC·Filed 2000·Granted Dec 4, 2001·24 cites·12 claims
- 0677US8400844B2System and method for reducing pin-count of memory devices, and memory device testers for sameGATZEMEIER SCOTT·Filed 2011·Granted Mar 19, 2013·5 cites·25 claims
- 0777US7554858B2System and method for reducing pin-count of memory devices, and memory device testers for sameMICRON TECHNOLOGY INC·Filed 2007·Granted Jun 30, 2009·8 cites·10 claims
- 0875US6049505AMethod and apparatus for generating memory addresses for testing memory devicesMICRON TECHNOLOGY INC·Filed 1998·Granted Apr 11, 2000·23 cites·37 claims
- 0971US8072820B2System and method for reducing pin-count of memory devices, and memory device testers for sameGATZEMEIER SCOTT·Filed 2009·Granted Dec 6, 2011·6 cites·27 claims
- 1068US6839292B2Apparatus and method for parallel programming of antifusesMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 4, 2005·16 cites·29 claims
- 1155US6538938B2Method for generating memory addresses for accessing memory-cell arrays in memory devicesMICRON TECHNOLOGY INC·Filed 2001·Granted Mar 25, 2003·5 cites·5 claims
- 1255US6483773B1Method for generating memory addresses for testing memory devicesMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 19, 2002·5 cites·33 claims
- 1344US6510102B2Method for generating memory addresses for accessing memory-cell arrays in memory devicesMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 21, 2003·2 cites·4 claims
- 1439US6115303AMethod and apparatus for testing memory devicesMICRON TECHNOLOGY INC·Filed 1998·Granted Sep 5, 2000·4 cites·36 claims
- 1533US6285609B1Method and apparatus for testing memory devicesMICRON TECHNOLOGY INC·Filed 1999·Granted Sep 4, 2001·2 cites·16 claims
- 1630US6252811B1Method and apparatus for testing memory devicesMICRON TECHNOLOGY INC·Filed 1999·Granted Jun 26, 2001·0 cites·10 claims
- 1730US6104669AMethod and apparatus for generating memory addresses for testing memory devicesMICRON TECHNOLOGY INC·Filed 1999·Granted Aug 15, 2000·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →